100-300 kV - Publications

    2015


  1. Abellan, P., L.R. Parent, T.H. Moser, C. Park, N. Al Hasan, I.T. Lucas, I. Arslan, et al. 2015. Controlled Radiolytic Synthesis in the Fluid Stage . Towards Understanding the Effect of the Electron Beam in Liquids. Microscopy and Microanalysis 21, no. 1061: 2125–2126.

  2. Ahmad, E.A., V. Tileli, D. Kramer, G. Mallia, K.A. Stoerzinger, Y. Shao-Horn, A.R. Kucernak, and N.M. Harrison. 2015. Optimizing Oxygen Reduction Catalyst Morphologies from First Principles. Journal of Physical Chemistry C 119, no. 29: 16804–16810.

  3. Akamine, H., K.H.W. Van Den Bos, N. Gauquelin, S. Farjami, S. Van Aert, D. Schryvers, and M. Nishida. 2015. Determination of the Atomic Width of an APB in Ordered CoPt Using Quantified HAADF-STEM. Journal of Alloys and Compounds 644: 570–574.

  4. Akdas, T., M. Distaso, S. Kuhri, B. Winter, B. Birajdar, E. Spiecker, D.M. Guldi, and W. Peukert. 2015. The Effects of Post-Processing on the Surface and the Optical Properties of Copper Indium Sulfide Quantum Dots. Journal of Colloid and Interface Science 445: 337–347.

  5. Akdas, T., J. Walter, D. Segets, M. Distaso, B. Winter, B. Birajdar, E. Spiecker, and W. Peukert. 2015. Investigation of the Size–property Relationship in CuInS 2 Quantum Dots. Nanoscale 7, no. 43: 18105–18118.

  6. Al Balushi, Z.Y., T. Miyagi, Y.C. Lin, K. Wang, L. Calderin, G. Bhimanapati, J.M. Redwing, and J.A. Robinson. 2015. The Impact of Graphene Properties on GaN and AlN Nucleation. Surface Science 634: 81–88.

  7. Aoki, T., M.R. McCartney, and D.J. Smith. 2015. Large-Collection-Angle BF STEM Imaging of Compound Semiconductors. Microscopy and Microanalysis 21, no. S3: 1921–1922.

  8. Aoki, T., L.A.J. Garvie, and P. Rez. 2015. Observation of Color Center Peaks in Calcium Fluoride. Ultramicroscopy 153: 40–44.

  9. Asayesh-Ardakani, H., A. Nie, P.M. Marley, Y. Zhu, P.J. Phillips, S. Singh, F. Mashayek, et al. 2015. Atomic Origins of Monoclinic-Tetragonal (Rutile) Phase Transition in Doped VO2 Nanowires. Nano Letters 15, no. 11: 7179–7188.

  10. Azough, F., D. Kepaptsoglou, Q.M. Ramasse, B. Schaffer, and R. Freer. 2015. Absence of Phase Separation in Nano-Chessboard Super-Lattices in A-Site Deficient Ca-Stabilized Nd2/3TiO3. Microscopy and Microanalysis 21, no. Supplement S3: 1353–1354.

  11. Baalousha, M., K.P. Arkill, I. Romer, R.E. Palmer, and J.R. Lead. 2015. Transformations of Citrate and Tween Coated Silver Nanoparticles Reacted with Na???S. The Science of the Total Environment 502: 344–353.

  12. Balcells, L., M. Paradinas, N. Bagu??s, N. Domingo, R. Moreno, R. Galceran, M. Walls, et al. 2015. Enhanced Conduction and Ferromagnetic Order at (100)-Type Twin Walls in L a0.7 S r0.3Mn O3 Thin Films. Physical Review B - Condensed Matter and Materials Physics 92, no. 7: 1–6.

  13. Bartling, S., C. Yin, I. Barke, K. Oldenburg, H. Hartmann, V. Von Oeynhausen, M. Pohl, K. Houben, E.C. Tyo, and P. Lievens. 2015. Pronounced Size Dependence in Structure and Morphology of Gas- Phase Produced , Partially Oxidized Cobalt Nanoparticles under Catalytic Reaction Conditions. Nano 9, no. 6: 5984–5998.

  14. Batuk, D., M. Batuk, A.M. Abakumov, and J. Hadermann. 2015. Synergy between Transmission Electron Microscopy and Powder Diffraction: Application to Modulated Structures. Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials 71: 127–143.

  15. Becher, C., L. Maurel, U. Aschauer, M. Lilienblum, C. Magén, D. Meier, E. Langenberg, et al. 2015. Strain-Induced Coupling of Electrical Polarization and Structural Defects in SrMnO3 Films. Nature Nanotechnology 10, no. 8: 661–665.

  16. Bennett, J.M., J.S. Barnard, H.J. Stone, P.A. Midgley, D. Rugg, and N.G. Jones. 2015. On the Nature of the Omega Tri-Layer Periodicity in Rapidly Cooled Ti-15Mo. Scripta Materialia 107: 79–82.

  17. Bertali, G., Y. Wang, J.J.H. Lim, F. Scenini, C.J. Long, P.D. Freyer, M.G. Burke, and M.P. Centre. 2015. Microstructural Analysis of 3D-Printed Alloy 718. Microscopy and Microanalysis 21, no. S3: 463–464.

  18. Bertali, G., F. Scenini, and M.G. Burke. 2015. Advanced Microstructural Characterization of the Intergranular Oxidation of Alloy 600. Corrosion Science 100: 474–483.

  19. Beyer, A., N. Knaub, and K. Volz. 2015. Quantitative Determination of Chemical Composition of Multinary III / V Semiconductors With Sublattice Resolution Using Aberration Corrected. Microscopy and Microanalysis 21, no. 1039: 2081–2082.

  20. Beyer, A., R. Straubinger, J. Belz, and K. Volz. 2015. Local Sample Thickness Determination via Scanning Transmission Electron Microscopy Defocus Series. Journal of Microscopy 0, no. 0: 1–7.

  21. Blackmore, C.E., N. V Rees, and R.E. Palmer. 2015. Modular Construction of Size-Selected Multiple-Core Pt-TiO2 Nanoclusters for Electro-Catalysis. Physical Chemistry Chemical Physics : PCCP 17, no. 42: 28005–28009.

  22. Bohra, M., P. Grammatikopoulos, R.E. Diaz, V. Singh, J. Zhao, J.F. Bobo, A. Kuronen, F. Djurabekova, K. Nordlund, and M. Sowwan. 2015. Surface Segregation in Chromium-Doped NiCr Alloy Nanoparticles and Its Effect on Their Magnetic Behavior. Chemistry of Materials 27, no. 9: 3216–3225.

  23. Bonifacio, C.S., H.L. Xin, S. Carenco, M. Salmeron, E.A. Stach, and C. Judith. 2015. In Situ Studies of the Reaction-Driven Restructuring of Ni-Co Core-Shell Nanoparticles. Microscopy and Microanalysis 21, no. 319: 2007–2008.

  24. Bowers, M.L., A. Gautam, C. Ophus, F. Lançon, and U. Dahmen. 2015. Collective Atomic Motion at a 90 ° <110> Tilt Grain Boundary in Gold. Microscopy and Microanalysis 21, no. 1127: 2257–2258.

  25. Bowman, W.J., A. Darbal, M. Kelly, G.S. Rohrer, C.H. Hernandez, and K. Mcguinness. 2015. Grain Boundaries across Length Scales: Correlating SEM , Aberration- Corrected TEM Orientation Imaging and Nanospectroscopy. Microscopy and Microanalysis 21, no. 246: 491–492.

  26. Boyes, E.D., and P.L. Gai. 2015. Visualizing Reacting Single Atoms in Chemical Reactions: Advancing the Frontiers of Materials Research. MRS Bulletin 40, no. 7: 600–609.

  27. Brazdil, J.F., M.A. Toft, S.S.Y. Lin, S.T. McKenna, G. Zajac, J.A. Kaduk, and J.T. Golab. 2015. Characterization of Bismuth-Cerium-Molybdate Selective Propylene Ammoxidation Catalysts. Applied Catalysis A: General 495: 115–123.

  28. Polychroniadis, E.K., A.Y. Oral, and M. Ozer. 2015. 2nd International Multidisciplinary Microscopy and Microanalysis Congress: Proceedings of InterM, October 16???19, 2014 123. Springer Proceedings in Physics 164: 19–23.

  29. Bu, L., J. Ding, S. Guo, X. Zhang, D. Su, X. Zhu, J. Yao, J. Guo, G. Lu, and X. Huang. 2015. A General Method for Multimetallic Platinum Alloy Nanowires as Highly Active and Stable Oxygen Reduction Catalysts. Advanced Materials 27, no. 44: 7204–7212.

  30. Bugnet, M., G. Radtke, S. Löffler, P. Schattschneider, D. Hawthorn, and G.A. Sawatzky. 2015. Aberration Corrected STEM-EELS Study of the Hole Distribution in Cuprate Superconductors. Microscopy and Microanalysis 21, no. 333: 665–666.

  31. Cantoni, C., M.A. McGuire, B. Saparov, A.F. May, T. Keiber, F. Bridges, A.S. Sefat, and B.C. Sales. 2015. Room-Temperature Ba(Fe<inf>1-x</inf>Co<inf>x</inf>)<inf>2</inf>As<inf>2</inf> Is Not Tetragonal: Direct Observation of Magnetoelastic Interactions in Pnictide Superconductors. Advanced Materials 27, no. 17: 2715–2721.

  32. Casavola, M., J. Hermannsdörfer, N. De Jonge, A.I. Dugulan, and K.P. De Jong. 2015. Fabrication of Fischer-Tropsch Catalysts by Deposition of Iron Nanocrystals on Carbon Nanotubes. Advanced Functional Materials 25, no. 33: 5309–5319.

  33. Di Castro, D., C. Cantoni, F. Ridolfi, C. Aruta, A. Tebano, N. Yang, and G. Balestrino. 2015. High- Tc Superconductivity at the Interface between the CaCuO2 and SrTiO3 Insulating Oxides. Physical Review Letters 115, no. 14: 1–5.

  34. Chen, Y., H. Téllez, M. Burriel, F. Yang, N. Tsvetkov, Z. Cai, D.W. McComb, J.A. Kilner, and B. Yildiz. 2015. Segregated Chemistry and Structure on (001) and (100) Surfaces of (La 1– X Sr X ) 2 CoO 4 Override the Crystal Anisotropy in Oxygen Exchange Kinetics. Chemistry of Materials 27, no. 15: 5436–5450.

  35. Chen, Z., A.J. D’Alfonso, M. Weyland, D.J. Taplin, L.J. Allen, and S.D. Findlay. 2015. Energy Dispersive X-Ray Analysis on an Absolute Scale in Scanning Transmission Electron Microscopy. Ultramicroscopy 157: 21–26.

  36. Cheng, G., C. Miao, Q. Qin, J. Li, F. Xu, H. Haftbaradaran, E.C. Dickey, H. Gao, and Y. Zhu. 2015. Large Anelasticity and Associated Energy Dissipation in Single-Crystalline Nanowires. Nat Nanotechnol 10, no. 8: 687–691.

  37. Chi, M., C. Wang, Y. Lei, G. Wang, D. Li, K.L. More, A. Lupini, L.F. Allard, N.M. Markovic, and V.R. Stamenkovic. 2015. Surface Faceting and Elemental Diffusion Behaviour at Atomic Scale for Alloy Nanoparticles during in Situ Annealing. Nature Communications 6: 8925.

  38. Chubarov, M., H. Pedersen, H. H??gberg, Z. Czig??ny, M. Garbrecht, and A. Henry. 2015. Polytype Pure sp2-BN Thin Films as Dictated by the Substrate Crystal Structure. Chemistry of Materials 27, no. 5: 1640–1645.

  39. Cooper, D., N. Bernier, and J.L. Rouvi??re. 2015. Combining 2 Nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction. Nano Letters 15, no. 8: 5289–5294.

  40. Cucinotta, C.S., K. Dolui, H. Pettersson, Q.M. Ramasse, E. Long, S.E. O’Brian, V. Nicolosi, and S. Sanvito. 2015. Electronic Properties and Chemical Reactivity of TiS 2 Nanoflakes. The Journal of Physical Chemistry C 119, no. 27: 15707–15715.

  41. Curtin, A.E., R. Skinner, and A.W. Sanders. 2015. A Simple Metric for Determining Resolution in Optical, Ion, and Electron Microscope Images. Microscopy and Microanalysis 21: 771–777.

  42. Dai, S., M. rigen He, and J. Zhu. 2015. E-Beam-Induced in Situ Structural Transformation in One-Dimensional Nanomaterials. Science Bulletin 60, no. 1: 71–75.

  43. Daio, T., A. Staykov, L. Guo, J. Liu, M. Tanaka, S. Matthew Lyth, and K. Sasaki. 2015. Lattice Strain Mapping of Platinum Nanoparticles on Carbon and SnO2 Supports. Scientific Reports 5: 13126.

  44. Dawson, K., S.J. Haigh, G.J. Tatlock, and A.R. Jones. 2015. Nano-Particle Precipitation in Mechanically Alloyed and Annealed Precursor Powders of Legacy PM2000 ODS Alloy. Journal of Nuclear Materials 464: 200–209.

  45. Dawson, K., and G.J. Tatlock. 2015. Preparation of Micro-Foils for TEM/STEM Analysis from Metallic Powders. Micron 74: 54–58.

  46. Deng, L., S. Mi, D. Chen, Y. Wang, and X. Ma. 2015. Structural and Electronic Properties of BaO/MgO(001)-Type Interface Studied via Aberration-Corrected Transmission Electron Microscopy and First-Principles Calculations. Journal of Materials Science & Technology 31, no. 2: 205–209.

  47. Ding, K., A. Gulec, A.M. Johnson, N.M. Schweitzer, G.D. Stucky, L.D. Marks, and P.C. Stair. 2015. Identification of Active Sites in CO Oxidation and Water-Gas Shift over Supported Pt Catalysts. Science 350, no. 6257: 189–192.

  48. Dwyer, C., C.B. Boothroyd, S.L.Y. Chang, and R.E. Dunin-Borkowski. 2015. Three-Wave Electron Vortex Lattices for Measuring Nanofields. Ultramicroscopy 148: 25–30.

  49. Elkjær, C.F., S.B. Vendelbo, H. Falsig, I. Puspitasari, P. Dona, L. Mele, and B. Morana. 2015. Electron Microscopy Advances for Studies of Catalysis at Atomic-Resolution and at Ambient Pressure Levels. Microscopy and Microanalysis 21, no. 210: 419–420.

  50. Ewbank, J.L., L. Kovarik, F.Z. Diallo, and C. Sievers. 2015. Effect of Metal-Support Interactions in Ni/Al<inf>2</inf>O<inf>3</inf> Catalysts with Low Metal Loading for Methane Dry Reforming. Applied Catalysis A: General 494: 57–67.

  51. Jo, W., T. Kim, D. Kim, and S.K. Pabi. 2015. Effects of Ti Concentration on the Growth of Chemically-Ordered Regions of Pb (Mg1/3Nb2/3)O3-PbTiO3 Epitaxial Thin Films. Journal of the Ceramic Society of Japan 123, no. 7: 565–569.

  52. Farahi, N., S. Prabhudev, G.A. Botton, J. Zhao, J.S. Tse, Z. Liu, J.R. Salvador, and H. Kleinke. 2015. Local Structure and Thermoelectric Properties of Mg2Si0.977-xGexBi0.023 (0.1 ≤ X ≤ 0.4). Journal of Alloys and Compounds 644: 249–255.

  53. Frechero, M. 2015. Paving the Way to Nanoionics: Atomic Origin of Barriers for Ionic Transport through Interfaces. Scientific Reportsno. submitted: 1–9.

  54. Gai, P.L., L. Lari, M.R. Ward, T. Martin, R.W. Mitchell, D. Lloyd, A. Lagrow, I. Wright, and E.D. Boyes. 2015. Recent Progress with AC E ( S ) TEM and Application to Single Atom Catalysis. Microscopy and Microanalysis 21, no. 366: 731–732.

  55. Gallagher, J.D., C.L. Senaratne, P. Sims, T. Aoki, J. Menéndez, and J. Kouvetakis. 2015. Electroluminescence from GeSn Heterostructure Pin Diodes at the Indirect to Direct Transition. Applied Physics Letters 106, no. 9: 20–23.

  56. Gao, P., R. Ishikawa, E. Tochigi, A. Kumamoto, N. Shibata, and Y. Ikuhara. 2015. Annular Bright-Field Electron Microscopy Tracking Solid-State Chemical Reaction. Microscopy and Microanalysis 21, no. Supplement S3: 963–964.

  57. Gao, W., S. Sivaramakrishnan, J. Wen, and J.M. Zuo. 2015. Direct Observation of Interfacial Au Atoms on TiO2 in Three Dimensions. Nano Letters 15, no. 4: 2548–2554.

  58. Gao, X., C.A.J. Fisher, Y.H. Ikuhara, Y. Fujiwara, S. Kobayashi, H. Moriwake, A. Kuwabara, et al. 2015. Cation Ordering in A-Site-Deficient Li-Ion Conducting Perovskites La (1−x)/3 Li x NbO 3. J. Mater. Chem. A 3, no. 7: 3351–3359.

  59. Gao, Z., J.Z. Liu, J.H. Chen, S.Y. Duan, Z.R. Liu, W.Q. Ming, and C.L. Wu. 2015. Formation Mechanism of Precipitate T1 in AlCuLi Alloys. Journal of Alloys and Compounds 624: 22–26.

  60. Gao, P., Y. Zhang, S.Y. Zhang, S. Lee, J. Weiss, J.R. Jokisaari, E.E. Hellstrom, D.C. Larbalestier, C.B. Eom, and X.Q. Pan. 2015. Atomic and Electronic Structures of Superconducting BaFe2As2/SrTiO3 Superlattices. Physical Review B - Condensed Matter and Materials Physics 91, no. 10: 1–5.

  61. Gao, W., S. Sivaramakrishnan, J. Wen, and J.M. Zuo. 2015. Direct Observation of Interfacial Au Atoms on TiO2 in Three Dimensions. Nano Letters 15, no. 4: 2548–2554.

  62. Gautam, A., C. Ophus, F. Lançon, P. Denes, and U. Dahmen. 2015. Analysis of Grain Boundary Dynamics Using Event Detection and Cumulative Averaging. Ultramicroscopy 151: 78–84.

  63. Ge, C., K.J. Jin, L. Gu, L.C. Peng, Y.S. Hu, H.Z. Guo, H.F. Shi, et al. 2015. Metal-Insulator Transition Induced by Oxygen Vacancies from Electrochemical Reaction in Ionic Liquid-Gated Manganite Films. Advanced Materials Interfaces 2, no. 17: 1–6.

  64. Ge, J., D. He, L. Bai, R. You, H. Lu, Y. Lin, C. Tan, et al. 2015. Ordered Porous Pd Octahedra Covered with Monolayer Ru Atoms. Journal of the American Chemical Society 137, no. 46: 14566–14569.

  65. Ge, B., Y. Wang, H. Luo, H. Wen, R. Yu, Z. Cheng, and J. Zhu. 2015. Determination of the Incommensurate Modulated Structure of Bi2Sr1.6La0.4CuO6+δ by Aberration-Corrected Transmission Electron Microscopy. Ultramicroscopy 159, no. P1: 67–72.

  66. Ghafoor, N., I. Petrov, D.O. Klenov, B. Freitag, J. Jensen, J.E. Greene, L. Hultman, and M. Od??n. 2015. Self-Organized Anisotropic (Zr1-xSix)Ny Nanocomposites Grown by Reactive Sputter Deposition. Acta Materialia 82: 179–189.

  67. Ghosh, S., R. Gaspari, G. Bertoni, M.C. Spadaro, M. Prato, S. Turner, A. Cavalli, L. Manna, and R. Brescia. 2015. Pyramid-Shaped Wurtzite CdSe Nanocrystals with Inverted Polarity. ACS Nanono. 8: 150723173715008.

  68. Gilks, D., D.M. Kepaptsoglou, K. McKenna, L. Lari, Q.M. Ramasse, K. Matsuzaki, T. Susaki, and V.K. Lazarov. 2015. Atomic Study of Fe3O4/SrTiO3 Interface. Microscopy and Microanalysis 21, no. Supplement S3: 1299–1300.

  69. Gontard, L.C., and R.E. Dunin-Borkowski. 2015. Transmission Electron Microscopy of Thiol-Capped Au Clusters on C: Structure and Electron Irradiation Effects. Micron 70: 41–49.

  70. Goris, B., J. De Beenhouwer, A. De Backer, D. Zanaga, K.J. Batenburg, A. S??nchez-Iglesias, L.M. Liz-Marz??n, et al. 2015. Measuring Lattice Strain in Three Dimensions through Electron Microscopy. Nano Letters 15, no. 10: 6996–7001.

  71. Griffiths, J.T., S. Zhang, B. Rouet-Leduc, W.Y. Fu, A. Bao, D. Zhu, D.J. Wallis, et al. 2015. Nanocathodoluminescence Reveals Mitigation of the Stark Shift in InGaN Quantum Wells by Si Doping. Nano Letters 15, no. 11: 7639–7643.

  72. Gulec, A., P.J. Phillips, and R.F. Klie. 2015. Position-Sensitive Change in the Transition Metal L-Edge Fine Structures. Applied Physics Letters 107, no. 14: 143111.

  73. Guo, F., N. Li, F.W. Fecher, N. Gasparini, C.O.R. Quiroz, C. Bronnbauer, Y. Hou, et al. 2015. A Generic Concept to Overcome Bandgap Limitations for Designing Highly Efficient Multi-Junction Photovoltaic Cells. Nature Communications 6: 7730.

  74. Guo, H., R. Zhao, K.J. Jin, L. Gu, D. Xiao, Z. Yang, X. Li, et al. 2015. Interfacial-Strain-Induced Structural and Polarization Evolutions in Epitaxial Multiferroic BiFeO3 (001) Thin Films. ACS Applied Materials and Interfaces 7, no. 4: 2944–2951.

  75. Gupta, G., P. Iqbal, F. Yin, J. Liu, R.E. Palmer, S. Sharma, K.C.F. Leung, and P.M. Mendes. 2015. Pt Diffusion Dynamics for the Formation Cr-Pt Core-Shell Nanoparticles. Langmuir 31, no. 24: 6917–6923.

  76. Guzzinati, G., L. Clark, A. Béché, R. Juchtmans, R. Van Boxem, M. Mazilu, and J. Verbeeck. 2015. Prospects for Versatile Phase Manipulation in the TEM: Beyond Aberration Correction. Ultramicroscopy 151: 85–93.

  77. Haberfehlner, G., P. Thaler, D. Knez, A. Volk, F. Hofer, W.E. Ernst, and G. Kothleitner. 2015. Formation of Bimetallic Clusters in Superfluid Helium Nanodroplets Analysed by Atomic Resolution Electron Tomography. Nature Communications 6: 8779.

  78. Hahn, H., B. Pécz, A. Kovács, M. Heuken, H. Kalisch, and A. Vescan. 2015. Controlling the Interface Charge Density in GaN-Based Metal-Oxide-Semiconductor Heterostructures by Plasma Oxidation of Metal Layers. Journal of Applied Physics 117, no. 21: 214503.

  79. Han, C.W., P. Majumdar, E.E. Marinero, A. Aguilar-Tapia, R. Zanella, J. Greeley, and V. Ortalan. 2015. Highly Stable Bimetallic AuIr/TiO2 Catalyst: Physical Origins of the Intrinsic High Stability against Sintering. Nano Letters 15, no. 12: 8141–8147.

  80. Han, X., L. Wang, Y. Yue, and Z. Zhang. 2015. In Situ Atomic Scale Mechanical Microscopy Discovering the Atomistic Mechanisms of Plasticity in Nano-Single Crystals and Grain Rotation in Polycrystalline Metals. Ultramicroscopy 151: 94–100.

  81. Han, C.W., V. Etacheri, C.N. Hong, V.G. Pol, and V. Ortalan. 2015. A Correlative Study of HRTEM , HAADF-STEM , and STEM-EELS Spectrum Imaging for Biphasic Electrochemically Active TiO 2. Microscopy and Microanalysis 21, no. 1065: 2133–2134.

  82. Han, C.W., H. Iddir, A. Uzun, L.A. Curtiss, N.D. Browning, B.C. Gates, and V. Ortalan. 2015. Migration of Single Iridium Atoms and Tri-Iridium Clusters on MgO Surfaces: Aberration-Corrected STEM Imaging and Ab Initio Calculations. Journal of Physical Chemistry Letters 6, no. 23: 4675–4679.

  83. Harunsani, M.H., J.Q. Li, Y.B. Qin, H.T. Tian, J.Q. Li, H.X. Yang, and R.I. Walton. 2015. Spontaneous Formation of Circular and Vortex Ferroelectric Domain Structure in Hexagonal YMnO3 and YMn0.9Fe0.1O3 Prepared by Low Temperature Solution Synthesis. Applied Physics Letters 107, no. 6: 62905.

  84. Haugan, H.J., G.J. Brown, K. Mahalingam, and L. Grazulis. 2015. Growth Optimization Studies to Develop InAs/GaInSb Superlattice Materials for Very Long Wavelength Infrared Detection. Infrared Physics and Technology 70: 99–102.

  85. Hauge, H.I.T., M.A. Verheijen, S. Conesa-Boj, T. Etzelstorfer, M. Watzinger, D. Kriegner, I. Zardo, et al. 2015. Hexagonal Silicon Realized. Nano Letters 15, no. 9: 5855–5860.

  86. He, L., P. Zhang, M.F. Besser, M.J. Kramer, and P.M. Voyles. 2015. Electron Correlation Microscopy: A New Technique for Studying Local Atom Dynamics Applied to a Supercooled Liquid. Microscopy and Microanalysis 21, no. 4: 1026–1033.

  87. He, K., F. Lin, Y. Mo, H.L. Xin, and D. Su. 2015. Contrasting Reaction Modality between Electrochemical Sodiation and Lithiation in NiO Conversion Electrode Materials. Microscopy and Microanalysis 21, no. 163: 325–326.

  88. He, L., J. Pakarinen, X. Bai, J. Gan, Y. Wang, and A. El-azab. 2015. Inert Gas Measurement of Single Bubble in CeO 2. Microscopy and Microanalysis 21, no. 376: 751–752.

  89. He, K., F. Lin, Y. Zhu, X. Yu, J. Li, R. Lin, D. Nordlund, et al. 2015. Sodiation Kinetics of Metal Oxide Conversion Electrodes: A Comparative Study with Lithiation. Nano Letters 15, no. 9: 5755–5763.

  90. He, Z., D. Wei, X. Shen, Y. Chen, H. Ma, L. Wang, K. Du, Y. Yao, and R. Yu. 2015. Approximants of Al-Cr-Fe-Si Decagonal Quasicrystals Described by Single Structural Block. Journal of Alloys and Compounds 647: 797–801.

  91. He, Q., J. Woo, A. Belianinov, V. V Guliants, and A.Y. Borisevich. 2015. Better Catalysts through Microscopy : Molybdenum À Vanadium Based Complex Oxide Catalysts for Propane. ACS Nano 9, no. 4: 3470–3478.

  92. Cell, U., Q. He, R. Ishikawa, A.R. Lupini, L. Qiao, E.J. Moon, and O. Ovchinnikov. 2015. Towards 3D Mapping of BO 6 Octahedron Rotations at Perovskite. ACS Nano 9, no. 8: 8412–8419.

  93. Sullivan, M.M., J.T. Held, and A. Bhan. 2015. Structure and Site Evolution of Molybdenum Carbide Catalysts upon Exposure to Oxygen. Journal of Catalysis 326, no. 530: 82–91.

  94. Herring, R.A., and D. Hoyle. 2015. The Ultra-Stable Scanning Transmission Electron Holography Microscope. Microscopy and Microanalysis 21, no. Suppl 3: 347–348.

  95. Holse, C., C.F. Elkjær, A. Nierhoff, J. Sehested, I. Chorkendorff, S. Helveg, and J.H. Nielsen. 2015. Dynamic Behavior of CuZn Nanoparticles under Oxidizing and Reducing Conditions. Journal of Physical Chemistry C 119, no. 5: 2804–2812.

  96. Horton, M.K., S. Rhode, S.L. Sahonta, M.J. Kappers, S.J. Haigh, T.J. Pennycook, C.J. Humphreys, R.O. Dusane, and M.A. Moram. 2015. Segregation of in to Dislocations in InGaN. Nano Letters 15, no. 2: 923–930.

  97. Hou, C.C., S. Cao, W.F. Fu, and Y. Chen. 2015. Ultrafine CoP Nanoparticles Supported on Carbon Nanotubes as Highly Active Electrocatalyst for Both Oxygen and Hydrogen Evolution in Basic Media. ACS Applied Materials and Interfaces 7, no. 51: 28412–28419.

  98. Hou, Z., W. Wang, G. Xu, X. Zhang, Z. Wei, S. Shen, E. Liu, et al. 2015. High Electron Mobility and Large Magnetoresistance in the Half-Heusler Semimetal LuPtBi. Physical Review B - Condensed Matter and Materials Physics 92, no. 23: 1–9.

  99. Howe, J., Y. Hashimoto, X. Wang, M. Vara, D. Hoyle, and T. Schamp. 2015. Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging. Microscopy and Microanalysis 21, no. 632: 1265–1266.

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  845. Zhang, S. Y., Katz, M. B., Sun, K., Ezekoye, O. K., Nandasiri, M. I., Jen, H., Graham, G. W., & Pan, X. Q. (2013). Spatial Distribution of Cerium Valence in Model Planar Pd/Ce0.7Zr0.3O2 Catalysts. Microscopy and Microanalysis, 19(Suppl 2): 1712–1713. doi: 10.1017/S1431927613010556

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  1228. Mountjoy, G., Loche, D., Wang, P., Sader, K., & Corrias, A. (2011). Scanning Transmission Electron Microscopy Study of the Evolution of Needle-Like Nanostructures in CoFe 2 O 4 and NiFe 2 O 4 Silica Nanocomposite Aerogels. The Journal of Physical Chemistry C, 115: 5358-5365. doi: 10.1021/jp110472d

  1229. Mundy, J., Fitting Kourkoutis, L., Warusawithana, M., Schlom, D., & Muller, D. (2011). Probing Stoichiometry in LaAlO3/SrTiO3 Interfaces by Aberration-Corrected STEM. Microscopy and Microanalysis, 17: 1450-1451. doi: 10.1017/S1431927611008129.

  1230. Nakamichi, H., Yamada, K., & Sato, K. (2011). Sub-nanometre elemental analysis of Cu cluster in Fe-Cu-Ni alloy using aberration corrected STEM-EDS. Journal of Microscopy, 242: 55-61. doi: 10.1111/j.1365-2818.2010.03438.x.

  1231. Naohara, H., Okamoto, Y., & Toshima, N. (2011). Preparation and electrocatalytic activity of palladiumplatinum coreshell nanoalloys protected by a perfluorinated sulfonic acid ionomer. Journal of Power Sources, 196: 7510-7513. doi: 10.1016/j.jpowsour.2011.04.050.

  1232. Nelson, C. T., Gao, P., Jokisaari, J. R., Heikes, C., Adamo, C., Melville, A., Baek, S.-H., Folkman, C. M., Winchester, B., Gu, Y., Liu, Y., Zhang, K., Wang, E., Li, J., Chen, L.-Q., Eom, C.-B., Schlom, D. G., & Pan, X. (2011). Domain dynamics during ferroelectric switching. Science (New York, N.Y.), 334: 968-71. doi: 10.1126/science.1206980.

  1233. Nelson, C. T., Winchester, B., Zhang, Y., Kim, S.-J., Melville, A., Adamo, C., Folkman, C. M., Baek, S.-H., Eom, C.-B., Schlom, D. G., Chen, L.-Q., & Pan, X. (2011). Spontaneous Vortex Nanodomain Arrays at Ferroelectric Heterointerfaces. Nano Letters, 11: 828-834. doi: 10.1021/nl1041808

  1234. Okunishi, E., Sawada, H., & Kondo, Y. (2011). Reconstruction of Atomic Resolution STEM Images Using the Diffraction-Imaging Method with an Aberration-Corrected STEM. Microscopy and Microanalysis, 17: 1076-1077. doi: 10.1017/S1431927611006258.

  1235. Paraguay-Delgado, F., Leyva, C., & Ornelas, C. (2011). Nanobeam Electron Diffraction Study of MoO3 Nanorods and Nanobelts. Microscopy and Microanalysis, 17: 1930-1931. doi: 10.1017/S143192761101052X.

  1236. Pennycook, T., McBride, J., Rosenthal, S., Pantelides, S., & Pennycook, S. (2011). Structure of White Light Emitting CdSe Nanocrystals. Microscopy and Microanalysis, 17: 1636-1637. doi: 10.1017/S1431927611009056.

  1237. Phatak, C., Petford-Long, A. K., Heinonen, O., Tanase, M., & De Graef, M. (2011). Nanoscale structure of the magnetic induction at monopole defects in artificial spin-ice lattices. Physical Review B, 83: 174431. doi: 10.1103/PhysRevB.83.174431.

  1238. Ramachandra, R., Demers, H., & de Jonge, N. (2011). Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes. Applied physics letters, 98: 93109. doi: 10.1063/1.3561758.

  1239. Remmele, T., Albrecht, M., Irmscher, K., Fornari, R., & Stra burg, M. (2011). Pyramidal inversion domain boundaries revisited. Applied Physics Letters, 99: 141913. doi: 10.1063/1.3644132.

  1240. Roldan-Gutierrez, M., Hernandez-Maldonado, D., Hernandez-Saz, J., Herrera, M., Guerrero, M., Galindo, P., Alonso-Alvarez, D., Ripalda, J., Alen, B., Gonzalez, Y., Varela, M., Pennycook, S., & Molina, S. (2011). Compositional Mapping by Z-Contrast Imaging. Microscopy and Microanalysis, 17: 1728-1729. doi: 10.1017/S1431927611009512.

  1241. Rudnaya, M., Van den Broek, W., Doornbos, R., Kho, S., Mattheij, R., & Maubach, J. (2011). A New Method for Defocus and Astigmatism Correction in Electron Microscopy. Microscopy and Microanalysis, 17: 528-529. doi: 10.1017/S1431927611003515.

  1242. Satayanarayana, V., Kuchibhatla, T., Shutthanandan, V., Arey, B. W., Kovarik, L., Wang, C. M., Prosa, T. J., Ulfig, R. M., Thevuthasan, S., & Gorman, B. P. (2011). Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy. Microscopy and Microanalysis, 17: 760-761. doi: 10.1017/S1431927611004673.

  1243. Schamm-Chardon, S., Coulon, P. E., Lamagna, L., Wiemer, C., Baldovino, S., & Fanciulli, M. (2011). Combining HRTEM-EELS nano-analysis with capacitance-voltage measurements to evaluate high- thin films deposited on Si and Ge as candidate for future gate dielectrics. Microelectronic Engineering, 88: 419-422. doi: 10.1016/j.mee.2010.10.012.

  1244. Schamp, C., Casillas, G., & Jose-Yacaman, M. (2011). Phase Detection Using Low-Loss EELS with Aberration Corrected STEM. Microscopy and Microanalysis, 17: 820-821. doi: 10.1017/S1431927611004971.

  1245. Schmid, H., Okunishi, E., Oikawa, T., & Mader, W. (2011). Structural and elemental analysis of iron and indium doped zinc oxide by spectroscopic imaging in Cs-corrected STEM. Micron. doi: 10.1016/j.micron.2011.05.011.

  1246. Serpell, C. J., Cookson, J., Ozkaya, D., & Beer, P. D. (2011). Core@shell bimetallic nanoparticle synthesis via anion coordination. Nature Chemistry, 3: 478-483. doi: 10.1038/nchem.1030.

  1247. Shah, A., Nelson-Cheeseman, B., Bhattacharya, A., Zuo, J.-M., & Spence, J. (2011). Combining Scanning Transmission Electron Microscopy and Electron Diffraction to Understand the Atomic Structures of Oxide Superlattices. Microscopy and Microanalysis, 17: 1078-1079. doi: 10.1017/S143192761100626X.

  1248. Shiju, N., Yoshida, K., Boyes, E. D., Robert Brown, D., & Gai, P. L. (2011). Dynamic atomic scale in situ electron microscopy in the development of an efficient heterogeneous catalytic process for pharmaceutical NSAIDS. Catalysis Science & Technology, 1: 413. doi: 10.1039/c0cy00063a.

  1249. Small, M. W., Sanchez, S. I., Menard, L. D., Kang, J. H., Frenkel, A. I., & Nuzzo, R. G. (2011). The atomic structural dynamics of-Al2O3 supported Ir-Pt nanocluster catalysts prepared from a bimetallic molecular precursor: a study using aberration-corrected electron microscopy and X-ray absorption spectroscopy. Journal of the American Chemical Society, 133: 3582-3591. doi: 10.1021/ja110033g

  1250. Sudharshan Phani, P., Johanns, K., Duscher, G., Gali, A., George, E., & Pharr, G. (2011). Scanning transmission electron microscope observations of defects in as-grown and pre-strained Mo alloy fibers. Acta Materialia, 59: 2172-2179. doi: 10.1016/j.actamat.2010.12.018.

  1251. Takayanagi, K., Kim, S., Lee, S., Oshima, Y., Tanaka, T., Tanishiro, Y., Sawada, H., Hosokawa, F., Tomita, T., Kaneyama, T., & Kondo, Y. (2011). Electron microscopy at a sub-50 pm resolution. Journal of electron microscopy, 60 Suppl 1: S239-44. doi: 10.1093/jmicro/dfr048.

  1252. Tan, H., Turner, S., Yucelen, E., Verbeeck, J., & Van Tendeloo, G. (2011). 2D Atomic Mapping of Oxidation States in Transition Metal Oxides by Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy. Physical Review Letters, 107: 107602. doi: 10.1103/PhysRevLett.107.107602.

  1253. Tanaka, T., Takeshita, A., Kubota, T., Oshima, Y., Tanishiro, Y., & Takayanagi, K. (2011). Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 17: 1268-1269. doi: 10.1017/S1431927611007215.

  1254. Thron, A., Greene, P., Liu, K., & van Benthem, K. (2011). Wetting-Dewetting Transitions of Ultrathin Nickel Films Deposited on Silicon (100) Substrates. Microscopy and Microanalysis, 17: 1328-1329. doi: 10.1017/S1431927611007513.

  1255. Tiruvalam, R. C., Pritchard, J. C., Dimitratos, N., Lopez-Sanchez, J. A., Edwards, J. K., Carley, A. F., Hutchings, G. J., & Kiely, C. J. (2011). Aberration corrected analytical electron microscopy studies of sol-immobilized Au + Pd, AufPdg and PdfAug catalysts used for benzyl alcohol oxidation and hydrogen peroxide production. Faraday Discussions, 152: 63. doi: 10.1039/c1fd00020a.

  1256. Tripathi, J. K., Garbrecht, M., Sztrum-Vartash, C. G., Rabani, E., Kaplan, W. D., & Goldfarb, I. (2011). Coverage-dependent self-organized ordering of Co- and Ti-silicide nanoislands along step-bunch edges of vicinal Si(111). Physical Review B, 83: 165409. doi: 10.1103/PhysRevB.83.165409.

  1257. Trudeau, M., Veillette, R., & Zaghib, K. (2011). The Advantage of a Dedicated STEM for High-Resolution Structural and Chemical Analysis of Li-Ions Batteries Electrode Materials. Microscopy and Microanalysis, 17: 1666-1667. doi: 10.1017/S1431927611009202.

  1258. Turner, S., Lazar, S., Freitag, B., Egoavil, R., Verbeeck, J., Put, S., Strauven, Y., & Van Tendeloo, G. (2011). High resolution mapping of surface reduction in ceria nanoparticles. Nanoscale, 3: 3385-3390. doi: 10.1039/c1nr10510h

  1259. Uzun, A., Dixon, D. A., & Gates, B. C. (2011). Prototype Supported Metal Cluster Catalysts: Ir4 and Ir6. ChemCatChem, 3: 95-107. doi: 10.1002/cctc.201000271.

  1260. van Benthem, K., Bonifacio, C. S., Contescu, C. I., Gallego, N. C., & Pennycook, S. J. (2011). STEM imaging of single Pd atoms in activated carbon fibers considered for hydrogen storage. Carbon, 49: 4059-4063. doi: 10.1016/j.carbon.2011.05.016.

  1261. Varela, M., Gazquez, J., Bruno, F., Garcia-Barriocanal, J., Torija, M., Sharma, M., Oxley, M., Prange, M., Pantelides, S., Leighton, C., Leon, C., Santamaria, J., & Pennycook, S. (2011). Aberration Corrected STEM-EELS: Applications to Magnetic Materials. Microscopy and Microanalysis, 17: 796-797. doi: 10.1017/S1431927611004855.

  1262. Velazquez-Salazar, J. J., Esparza, R., Mejia-Rosales, S. J., Estrada-Salas, R., Ponce, A., Deepak, F. L., Castro-Guerrero, C. F., & Jose-Yacaman, M. (2011). Experimental Evidence of Icosahedral and Decahedral Packing in One-Dimensional Nanostructures. ACS Nano, 5: 6272-6278. doi: 10.1021/nn202495r.

  1263. Visani, C., Tornos, J., Nemes, N. M., Rocci, M., Leon, C., Santamaria, J., te Velthuis, S. G. E., Liu, Y., Hoffmann, A., Freeland, J. W., Garcia-Hernandez, M., Fitzsimmons, M. R., Kirby, B. J., Varela, M., & Pennycook, S. J. (2011). Symmetrical interfacial reconstruction and magnetism in La0.7Ca0.3MnO3/YBa2Cu3O7/La0.7Ca0.3MnO3 heterostructures. Physical Review B, 84: 060405. doi: 10.1103/PhysRevB.84.060405.

  1264. Viswanathan, G., Banerjee, R., Singh, A., Nag, S., Tiley, J., & Fraser, H. (2011). Precipitation of ordered phases in metallic solid solutions: A synergistic clustering and ordering process. Scripta Materialia, 65: 485-488. doi: 10.1016/j.scriptamat.2011.06.002.

  1265. Wade, T., Wittig, J., Davidson, J., Kang, W., Tolk, N., & Allard, L. (2011). Nanostructure Analysis of Diamond Cold-Cathode Field Emitters. Microscopy and Microanalysis, 17: 1508-1509. doi: 10.1017/S1431927611008415.

  1266. Wang, P., Behan, G., Kirkland, A. I., Nellist, P. D., Cosgriff, E. C., D'Alfonso, A. J., Morgan, A. J., Allen, L. J., Hashimoto, A., Takeguchi, M., Mitsuishi, K., & Shimojo, M. (2011). Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Ultramicroscopy, 111: 877-886. doi: 10.1016/j.ultramic.2010.10.012

  1267. Wang, Z. W., Toikkanen, O., Quinn, B. M., & Palmer, R. E. (2011). Real-space observation of prolate monolayer-protected Au(38) clusters using aberration-corrected scanning transmission electron microscopy. Small, 7: 1542-1545. doi: 10.1002/smll.201002168.

  1268. Wen, J., Bareno, J., Lei, C., Petrov, I., & Abraham, D. (2011). Direct Observation of Cation Ordering in Li1.2TM0.4 Mn0.4O2 (TM: Co, Fe) Lithium-Ion Battery Materials Using Aberration-corrected TEM. Microscopy and Microanalysis, 17: 1590-1591. doi: 10.1017/S1431927611008828.

  1269. Wu, L., Meng, Q., Inada, H., Su, D., Li, Q., & Zhu, Y. (2011). Determination of Displacive Modulation of Thermoelectric Ca3Co4O9 by Simultaneous Acquisitions of HAADF and MAADF Images. Microscopy and Microanalysis, 17: 1630-1631. doi: 10.1017/S1431927611009020.

  1270. Xie, W., Mobus, G., & Zhang, S. (2011). Molten salt synthesis of silicon carbide nanorods using carbon nanotubes as templates. Journal of Materials Chemistry, 21: 18325. doi: 10.1039/c1jm13186a.

  1271. Xin, H., Wang, D., Abruna, H., & Muller, D. (2011). Revealing Atomic-Scale Surface Segregation, Intermixing and Internal Ordering in Fuel Cell Nanocatalysts by Aberration-Corrected Spectroscopic Imaging. Microscopy and Microanalysis, 17: 1620-1621. doi: 10.1017/S143192761100897X.

  1272. Xu, B., Fell, C. R., Chi, M., & Meng, Y. S. (2011). Identifying surface structural changes in layered Li-excess nickel manganese oxides in high voltage lithium ion batteries: A joint experimental and theoretical study. Energy & Environmental Science, 4: 2223. doi: 10.1039/c1ee01131f.

  1273. Yamazaki, T., Kotaka, Y., & Kataoka, Y. (2011). Analysis of EEL spectrum of low-loss region using the C(s)-corrected STEM-EELS method and multivariate analysis. Ultramicroscopy, 111: 303-308. doi: 10.1016/j.ultramic.2011.01.005

  1274. Yin, F., Wang, Z. W., & Palmer, R. E. (2011). Controlled formation of mass-selected Cu-Au core-shell cluster beams. Journal of the American Chemical Society, 133: 10325-10327. doi: 10.1021/ja201218n

  1275. Yurdakul, H., Idrobo, J. C., Pennycook, S. J., & Turan, S. (2011). Towards atomic scale engineering of rare-earth-doped SiAlON ceramics through aberration-corrected scanning transmission electron microscopy. Scripta Materialia, 65: 656-659. doi: 10.1016/j.scriptamat.2011.06.038.

  1276. Zhang, W., Yu, R., Du, K., Cheng, Z., Zhu, J., & Ye, H. (2011). Undulating slip in Laves phase and implications for deformation in brittle materials. Physical Review Letters, 106: 165505. doi: 10.1103/PhysRevLett.106.165505

  1277. Zhang, X. (2011). STEM-based Technologies for Nano and Biological Sciences. Microscopy and Microanalysis, 17: 1164-1165. doi: 10.1017/S1431927611006696.

  1278. Zhang, Z., Daniel, R., & Mitterer, C. (2011). Atomic and electronic structures of a transition layer at the CrN/Cr interface. Journal of Applied Physics, 110: 043524. doi: 10.1063/1.3624772.

  1279. Zhang, Z., Dehm, G., Rashkova, B., Lazar, P., Redinger, J., & Podloucky, R. (2011). Atomic and Electronic Interface Structure of a VN Hard Coating on MgO. Microscopy and Microanalysis, 17: 1370-1371. doi: 10.1017/S1431927611007720.

  1280. Zhou, H., Chisholm, M. F., Yang, T.-H., Pennycook, S. J., & Narayan, J. (2011). Role of interfacial transition layers in VO2/Al2O3 heterostructures. Journal of Applied Physics, 110: 073515. doi: 10.1063/1.3642980.

  1281. Zhou, Z., Rainforth, W. M., Gass, M. H., Bleloch, A., Ehiassarian, A. P., & Hovsepian, P. E. (2011). C/CrC nanocomposite coating deposited by magnetron sputtering at high ion irradiation conditions. Journal of Applied Physics, 110: 073301. doi: 10.1063/1.3642996.

  1282. Zhu, G., Knights, A., & Botton, G. (2011). High Resolution Characterization on Point Defects in (Pr,Al) Implanted SrTiO3. Microscopy and Microanalysis, 17: 1632-1633. doi: 10.1017/S1431927611009032.

  1283. Zhu, Y., Lee, C.-H., Schlom, D., & Muller, D. (2011). Atomic Scale Chemical Mapping in SrO(SrTiO3)6 Ruddlesden-Popper Thin Film. Microscopy and Microanalysis, 17: 1396-1397. doi: 10.1017/S1431927611007859.

  1284. 2010


  1285. Allard, L. F., Bigelow, W. C., Overbury, S. H., Nackashi, D. P., & Damiano, J. (2010). Development of a Novel Environmental Cell for In-Situ Gas Reaction Experiments via Aberration-Corrected STEM Imaging. Microscopy and Microanalysis, 16: 296-297. doi: 10.1017/S1431927610062495.

  1286. Allard, L. F., Flytzani-Stephanopoulos, M., & Overbury, S. H. (2010). Behavior of Au species in Au/Fe2O3 catalysts characterized by novel in situ heating techniques and aberration-corrected STEM imaging. Microscopy and Microanalysis, 16: 375-85. doi: 10.1017/S1431927610013486.

  1287. Asoro, M. A., Kovar, D., Shao-Horn, Y., Allard, L. F., & Ferreira, P. J. (2010). Coalescence and sintering of Pt nanoparticles: in situ observation by aberration-corrected HAADF STEM. Nanotechnology, 21: 025701. doi: 10.1088/0957-4484/21/2/025701

  1288. Azough, F., Freer, R., & Schaffer, B. (2010). Direct observation of A-site vacancies and a twin boundary structure in La2/3TiO3-based ceramics using HAADF/STEM. Journal of the American Ceramic Society, 1240: 1237-1240. doi: 10.1111/j.1551-2916.2009.03540.x.

  1289. Baba-Kishi, K. Z. (2010). Direct observation of B-site cation displacements in Pb-based complex perovskite relaxor oxides. Journal of Applied Crystallography, 44: 111-121. doi: 10.1107/S0021889810042214.

  1290. Balogh, M. P. & Dutta, I. (2010). Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 16: 138-139. doi: 10.1017/S1431927610054310.

  1291. Barthel, J., Weirich, T. E., Cox, G., Hibst, H., & Thust, A. (2010). Structure of Cs0.5[Nb2.5W2.5O14] analysed by focal-series reconstruction and crystallographic image processing. Acta Materialia, 58: 3764-3772. doi: 10.1016/j.actamat.2010.03.016.

  1292. Barton, B., Schulthei, K., Matijevic, M., Gerthsen, D., & Kuhlbrandt, W. (2010). Optimized In-focus Boersch Phase Contrast in a Dedicated TEM. Microscopy and Microanalysis, 16: 540-541. doi: 10.1017/S1431927610056588.

  1293. Bell, D. C., Schillinger, R., & Kolmykov, D. (2010). 3D Correlative Analytical STEM at the Atomic Scale. Microscopy and Microanalysis, 16: 144-145. doi: 10.1017/S1431927610056473.

  1294. Biskupek, J., Jinschek, J. R., Wiedwald, U., Bendele, M., Han, L., Ziemann, P., & Kaiser, U. (2010). Identification of magnetic properties of few nm sized FePt crystalline particles by characterizing the intrinsic atom order using aberration corrected S/TEM. Ultramicroscopy, 110: 820-825. doi: 10.1016/j.ultramic.2010.02.043

  1295. Booth, T. J., Blake, P., Nair, R. R., Jiang, D., Hill, E. W., Bangert, U., Bleloch, A., Gass, M., Novoselov, K. S., Katsnelson, M. I., & Geim, A. K. (2010). A HAADF investigation of AlAs/GaAs interfaces using SuperSTEM. Journal of Physics: Conference Series, 241: 012049. doi: 10.1088/1742-6596/241/1/012049.

  1296. Braidy, N., Bouar, Y. L., Lazar, S., & Ricolleau, C. (2010). Detecting and Correcting Instabilities in STEM Images. Microscopy and Microanalysis, 16: 10-11. doi: 10.1017/S1431927610056539.

  1297. Buban, J. P., Ramasse, Q., Gipson, B., Browning, N. D., & Stahlberg, H. (2010). High-resolution low-dose scanning transmission electron microscopy. Journal of Electron Microscopy, 59: 103-112. doi: 10.1093/jmicro/dfp052

  1298. Cargnello, M., Gentilini, C., Montini, T., Fonda, E., Mehraeen, S., Chi, M., Herrera-Collado, M., Browning, N. D., Polizzi, S., Pasquato, L., & Fornasiero, P. (2010). Active and stable embedded Au@CeO2 catalysts for preferential oxidation of CO. Chemistry of Materials, 22: 4335-4345. doi: 10.1021/cm101499x.

  1299. Casanove, M. J., Combe, N., Houdellier, F., & Hytch, M. J. (2010). Visualising alloy fluctuations by spherical-aberrationcorrected HRTEM. EPL (Europhysics Letters), 91: 36001. doi: 10.1209/0295-5075/91/36001.

  1300. Cazottes, S., Zhang, Z., Daniel, R., Chawla, J., Gall, D., & Dehm, G. (2010). Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. Thin Solid Films, 519: 1662-1667. doi: 10.1016/j.tsf.2010.09.017.

  1301. Chang, L. Y., Barnard, A. S., Gontard, L. C., & Dunin-Borkowski, R. E. (2010). Resolving the structure of active sites on platinum catalytic nanoparticles. Nano Letters, 10: 3073-3076. doi: 10.1021/nl101642f

  1302. Cheng, C.-J., Borisevich, A. Y., Kan, D., Takeuchi, I., & Nagarajan, V. (2010). Nanoscale Structural and Chemical Properties of Antipolar Clusters in Sm-Doped BiFeO 3 Ferroelectric Epitaxial Thin Films. Chemistry of Materials, 22: 2588-2596. doi: 10.1021/cm903618y.

  1303. Cheynet, M., Pokrant, S., Irsen, S., & Kruger, P. (2010). New fine structures resolved at the ELNES Ti-L2,3 edge spectra of anatase and rutile: Comparison between experiment and calculation. Ultramicroscopy, 110: 1046-1053. doi: 10.1016/j.ultramic.2010.03.001.

  1304. Chi, M., Fell, C., & Meng, S. (2010). An Investigation of Structure and Electrochemical Cycling Stability of Li[Li0.2Ni0.2Mn0.6]O2 using Aberration-Corrected Z-contrast Imaging and EELS. Microscopy and Microanalysis, 16: 78-79. doi: .

  1305. Chisholm, M. F., Luo, W., Oxley, M. P., Pantelides, S. T., & Lee, H. N. (2010). Atomic-Scale Compensation Phenomena at Polar Interfaces. Physical Review Letters, 105: 197602. doi: 10.1103/PhysRevLett.105.197602.

  1306. Chu, M.-W., Liou, S. C., Chang, C.-P., Choa, F.-S., & Chen, C. H. (2010). Emergent chemical mapping at atomic-column resolution by energy-dispersive x-ray spectroscopy in an aberration-corrected electron microscope. Physical Review Letters, 104: 196101. doi: 10.1103/PhysRevLett.104.196101

  1307. Colliex, C., Bocher, L., De, F., Gloter, A., March, K., & Walls, M. (2010). Atomic-scale STEM-EELS Mapping across Functional Interfaces. The Member Journal of The Minerals, Metals & Materials Society, 62: 53-57. doi: 10.1007/s11837-010-0181-9

  1308. Couillard, M., Radtke, G., Knights, A. P., & Botton, G. A. (2010). Atom-by-Atom Analysis of Rare-Earth Dopants implanted in Silicon. Microscopy and Microanalysis, 16: 90-91. doi: 10.1017/S1431927610060885.

  1309. de Jonge, N., Sougrat, R., Northan, B. M., & Pennycook, S. J. (2010). Three-dimensional scanning transmission electron microscopy of biological specimens. Microscopy and Microanalysis, 16: 54-63. doi: 10.1017/S1431927609991280.

  1310. Deepak, F. L., Mayoral, A., Steveson, A. J., Rosales, S. M., Blom, D. A., & Jose-Yacaman, M. (2010). Insights into the capping and structure of MoS(2) nanotubes as revealed by aberration-corrected STEM. Nanoscale, 2: 2286-2293. doi: 10.1039/C0NR00484G

  1311. Dey, S., Buban, J. P., & Browning, N. D. (2010). The Structure of Strontium Titanate Bi-crystal Grain Boundaries. Microscopy and Microanalysis, 16: 1520-1521. doi: 10.1017/S1431927610060915.

  1312. Dimick, P. S. & Lyman, C. E. (2010). Cobalt Substituted for Rhodium in an Experimental NO Reduction Catalyst. Microscopy and Microanalysis, 16: 1190-1191. doi: 10.1017/S1431927610059532.

  1313. Drummy, L. F., Apt, S., Shiffler, D., Golby, K., LaCour, M., Maruyama, B., & Vaia, R. A. (2010). Nanostructural evolution during emission of CsI-coated carbon fiber cathodes. Journal of Applied Physics, 107: 113304. doi: 10.1063/1.3428463.

  1314. Du, K., Ernst, F., Pelsozy, M., Barthel, J., & Tillmann, K. (2010). Expansion of interatomic distances in platinum catalyst nanoparticles. Acta Materialia, 58: 836-845. doi: 10.1016/j.actamat.2009.09.061.

  1315. Dudeck, K. J., Benedek, N. A., Finnis, M. W., & Cockayne, D. J. H. (2010). Atomic-scale characterization of the SrTiO33(112)[1[over ]10] grain boundary. Physical Review B, 81: 134109. doi: 10.1103/PhysRevB.81.134109.

  1316. Dudeck, K. J. & Cockayne, D. J. H. (2010). A method for rigid body expansion measurement in the presence of secondary grain boundary dislocations applied to a SrTiO3 near-Sigma3(112) grain boundary. Ultramicroscopy, 110: 1320-1323. doi: 10.1016/j.ultramic.2010.06.009

  1317. Dudeck, K. J. & Cockayne, D. J. H. (2010). Quantitative high resolution electron microscopy image matching applied to the strontium titanate 3(112) grain boundary. Journal of Physics: Conference Series, 241: 012033. doi: 10.1088/1742-6596/241/1/012033.

  1318. Dudeck, K. J., Couillard, M., Cockayne, D. J. H., & Botton, G. (2010). HAADF STEM and EELS Investigations of Grain Boundaries in SrTiO3. Microscopy and Microanalysis, 16: 1518-1519. doi: 10.1017/S1431927610060198.

  1319. Dwyer, C., Erni, R., & Etheridge, J. (2010). Measurement of effective source distribution and its importance for quantitative interpretation of STEM images. Ultramicroscopy, 110: 952-957. doi: 10.1016/j.ultramic.2010.01.007

  1320. E, H., Nellist, P. D., Lozano-Perez, S., & Ozkaya, D. (2010). Towards quantitative analysis of core-shell catalyst nano-particles by aberration corrected high angle annular dark field STEM and EDX. Journal of Physics: Conference Series, 241: 012067. doi: 10.1088/1742-6596/241/1/012067.

  1321. Ercius, P., Duden, T., & Radmilovic, V. (2010). 3D Characterization of Faceted Core/Shell Nanoparticles by STEM Tomography with TEAM I. Microscopy and Microanalysis, 16: 1650-1651. doi: 10.1017/S1431927610060794.

  1322. Erni, R., Rossell, M. D., & Nakashima, P. N. H. (2010). Optimization of exit-plane waves restored from HRTEM through-focal series. Ultramicroscopy, 110: 151-161. doi: 10.1016/j.ultramic.2009.10.015

  1323. Falqui, A., Corrias, A., Wang, P., Snoeck, E., & Mountjoy, G. (2010). A Transmission Electron Microscopy Study of CoFe 2 O 4 Ferrite Nanoparticles in Silica Aerogel Matrix Using HREM and STEM Imaging and EDX Spectroscopy and EELS. Microscopy and Microanalysis, 16: 200-209. doi: 10.1017/S1431927610000061

  1324. Fitting Kourkoutis, L., Lee, J. H., Song, J. H., Hwang, H. Y., & Schlom, D. G. (2010). 2D Mapping of Bonding Changes at Peroskite Oxide Interfaces and Around Defects. Microscopy and Microanalysis, 16: 1400-1401. doi: 10.1017/S1431927610060460.

  1325. Gu, M., Takamura, Y., & Browning, N. D. (2010). Atomic Scale Characterization of LSFMO Thin Films Using Aberration Corrected STEM. Microscopy and Microanalysis, 16: 146-147. doi: 10.1017/S1431927610055649.

  1326. Haigh, S. J., Jiang, B., Alloyeau, D., Kisielowski, C., & Kirkland, A. I. (2010). Recording low spatial frequencies while maintaining information limit resolution using the TEAM I microscope. Microscopy and Microanalysis, 16: 524-525. doi: 10.1017/S1431927610055418.

  1327. Haigh, S. J., Sawada, H., Takayanagi, K., & Kirkland, A. I. (2010). Exceeding Conventional Resolution Limits in High- Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit-Wave Restoration. Microscopy and Microanalysis, 16: 409-415. doi: 10.1017/S1431927610093359

  1328. Hamada, E., Yamada, K., Nagoshi, M., Makiishi, N., Sato, K., Ishii, T., Fukuda, K., Ishikawa, S., & Ujiro, T. (2010). Direct imaging of native passive film on stainless steel by aberration corrected STEM. Corrosion Science, 52: 3851-3854. doi: 10.1016/j.corsci.2010.08.025.

  1329. Hansen, T. W., Wagner, J. B., & Dunin-Borkowski, R. E. (2010). Aberration corrected and monochromated environmental transmission electron microscopy: challenges and prospects for materials science. Materials Science and Technology, 26: 1338-1344. doi: 10.1179/026708310X12756557336355.

  1330. Harris, P. J. F., Liu, Z., & Suenaga, K. (2010). Imaging the structure of activated carbon using aberration corrected TEM. Journal of Physics: Conference Series, 241: 012050. doi: 10.1088/1742-6596/241/1/012050.

  1331. Hashimoto, A., Shimojo, M., Mitsuishi, K., & Takeguchi, M. (2010). Three-Dimensional Optical Sectioning by Scanning Confocal Electron Microscopy with a Stage-Scanning System. Microscopy and Microanalysis, 16: 233-238. doi: 10.1017/S1431927610000127

  1332. Hashimoto, A., Wang, P., Shimojo, M., Mitsuishi, K., Kirkland, A. I., & Nellist, P. D. (2010). Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope. Microscopy and Microanalysis, 16: 88-89. doi: 10.1016/j.ultramic.2010.10.012.

  1333. He, Q., Thomas, A., Edwards, J. K., Carley, A. F., Hutchings, G. J., & Kiely, C. J. (2010). Identifying potential active species in Au/ZnO CO Oxidation Catalysts. Microscopy and Microanalysis, 16: 1188-1189. doi: 10.1017/S1431927610060186.

  1334. Herzing, A. A., Anderson, M. D., & Anderson, I. M. (2010). Event-Streamed Spectral Imaging in an Aberration-Corrected AEM: A Robust Approach to High Spatial Resolution XEDS Elemental Mapping. Microscopy and Microanalysis, 16: 892-893. doi: 10.1017/S1431927610061167.

  1335. Hovden, R., Xin, H. L., & Muller, D. A. (2010). Determining Resolution in an Aberration-Corrected Era: Why Your Probe is Larger Than You Thought. Microscopy and Microanalysis, 16: 152-153. doi: 10.1017/S1431927610060319.

  1336. Hovden, R., Xin, H. L., & Muller, D. A. (2010). Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning. Microscopy and Microanalysis, 16: 1838-1839. doi: 10.1017/S1431927610060848.

  1337. Howe, J. Y., Allard, L. F., Bigelow, W. C., & Overbury, S. H. (2010). Synergy of Combined (S)TEM Imaging Techniques for the Characterization of Catalyst Behavior During In-Situ Heating. Microscopy and Microanalysis, 16: 312-313. doi: 10.1017/S1431927610061039.

  1338. Huang, P. Y., Cha, J. J., Read, J. C., Tseng, H.-W., Li, Y., & Gowtham, P. G. (2010). Correlating Nanoscale Defects with Electronic Properties in MgO Magnetic Tunnel Junctions by Aberration-Corrected STEM-EELS. Microscopy and Microanalysis, 16: 1908-1909. doi: 10.1017/S1431927610057259.

  1339. Hungria, T., Houdellier, F., Alguero, M., & Castro, A. (2010). Monoclinic symmetry of twin-free nanocrystals in the BiScO3-PbTiO3 solid solution as revealed by aberration-corrected TEM. Physical Review B, 81: 100102 (4 pages). doi: 10.1103/PhysRevB.81.100102

  1340. Hytch, M. J., Houdellier, F., Hue, F., & Snoeck, E. (2010). Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations. Journal of Physics Conference Series, 241: 012027. doi: 10.1088/1742-6596/241/1/012027.

  1341. Idrobo, J. C., Chisholm, M. F., Prange, M., Tao, J., Zhu, Y., Ren, Z.-A., Zhao, Z. X., Pantelides, S. T., & Pennycook, S. J. (2010). Revealing Electronic, Structural and Magnetic Phases in NdFeAsO with Electron Energy-Loss Spectroscopy. Microscopy and Microanalysis, 16: 88-89. doi: 10.1017/S1431927610060423.

  1342. Ikarashi, N. (2010). Atomic structure of a Ni diffused Si (001) surface layer: Precursor to formation of NiSi[sub 2] at low temperature. Journal of Applied Physics, 107: 033505. doi: 10.1063/1.3294691.

  1343. Inada, H., Konno, M., Suzuki, Y., Nakamura, K., Wall, J., & Zhu, Y. (2010). High Resolution Secondary-Electron and ADF-STEM Imaging with a Hitachi HD2700C Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 16: 102-103. doi: 10.1017/S1431927610059477.

  1344. Inada, H., Su, D., Konno, M., Nakamura, K., Egerton, R. F., Wall, J., & Zhu, Y. (2010). Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope. Microscopy and Microanalysis, 16: 610-611. doi: 10.1017/S1431927610059349.

  1345. Inamoto, S., Yamasaki, J., Okunishi, E., Kakushima, K., Iwai, H., & Tanaka, N. (2010). Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy. Journal of Applied Physics, 107: 124510. doi: 10.1063/1.3445874.

  1346. Jarvis, K. A., Allard, L. F., Jerome, T. Y., Isabell, T. C., Blom, D. A., & Ferreira, P. J. (2010). Aberration-Corrected STEM Imaging Through Off-Site Remote Operation. Microscopy and Microanalysis, 16: 1330-1331. doi: 10.1017/S1431927610061878.

  1347. Jarvis, K. A., Zhao, J., Allard, L. F., Manthiram, A., & Ferreira, P. J. (2010). Characterization of the Ternary Compound Pd 5 Pt 3 Ni 2 for PEMFC Cathode Electrocatalysts. Microscopy and Microanalysis, 16: 1812-1813. doi: 10.1017/S143192761006191X.

  1348. Jia, C. L., Houben, L., Thust, A., & Barthel, J. (2010). On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM. Ultramicroscopy, 110: 500-505. doi: 10.1016/j.ultramic.2009.10.006.

  1349. Kashtiban, R. J., Bangert, U., Crowe, I., Halsall, M. P., Sherliker, B., Harvey, A. J., Eccles, J., Knights, A. P., Gwilliam, R., & Gass, M. (2010). Structural and compositional study of Erbium-doped silicon nanocrystals by HAADF, EELS and HRTEM techniques in an aberration corrected STEM. Journal of Physics: Conference Series, 209: 012043 (4 pages). doi: 10.1088/1742-6596/209/1/012043.

  1350. Kim, S., Oshima, Y., Sawada, H., Hashikawa, N., & Asayama, K. (2010). Visualization of Antimony ( Sb ) Dopant Clusters in Silicon Specimen by Large Angle Convergent Beam HAADF-STEM. Microscopy and Microanalysis, 16: 1732-1733. doi: 10.1017/S143192761005871X.

  1351. Kim, S., Oshima, Y., Sawada, H., Hashikawa, N., Asayama, K., Kaneyama, T., Kondo, Y., Tanishiro, Y., & Takayanagi, K. (2010). A Dopant Cluster in a Highly Antimony Doped Silicon Crystal. Applied Physics Express, 3: 081301. doi: 10.1143/APEX.3.081301.

  1352. Klie, R. F. & Qiao, Q. (2010). Atomic-Resolution Annular Bright-Field and Spectrum Imaging of Incommensurately-layered Ca3Co4O9. Microscopy and Microanalysis, 16: 86-87. doi: 10.1017/S1431927610058538.

  1353. Kogure, T. & Okunishi, E. (2010). Cs-corrected HAADF-STEM imaging of silicate minerals. Journal of electron microscopy, 59: 263-71. doi: 10.1093/jmicro/dfq003.

  1354. Kohno, Y., Shibata, N., Sawada, H., Findlay, S. D., Kondo, Y., & Ikuhara, Y. (2010). Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes. Microscopy and Microanalysis, 16: 760-761. doi: 10.1017/S1431927610057120.

  1355. Konno, M., Suzuki, Y., Inada, H., Nakamura, K., Kimoto, K., & Zhu, Y. (2010). High- Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope. Microscopy and Microanalysis, 16: 128-129. doi: 10.1017/S1431927610054875.

  1356. Kotaka, Y. (2010). Essential experimental parameters for quantitative structure analysis using spherical aberration-corrected HAADF-STEM. Ultramicroscopy, 110: 555-562. doi: 10.1016/j.ultramic.2009.12.008

  1357. Kotaka, Y., Yamazaki, T., & Kataoka, Y. (2010). Atomic-resolution imaging and analysis with cs-corrected scanning transmission electron microscopy. Fujitsu scientific technical journal, 46: 249-256.

  1358. Kubel, C., Roth, A., Wang, D., & Fichtner, M. (2010). Porosity and Wetting Behavior in Model Systems for Hydrogen Storage. Microscopy and Microanalysis, 16: 1666-1667. doi: 10.1017/S1431927610058964.

  1359. Kulkarni, A., Chi, M., Ortalan, V., Browning, N. D., & Gates, B. C. (2010). Atomic resolution of the structure of a metal-support interface: triosmium clusters on MgO(110). Angewandte Chemie (International ed. in English), 49: 10089-92. doi: 10.1002/anie.201005105.

  1360. Lai, F.-J., Su, W.-N., Sarma, L. S., Liu, D.-G., Hsieh, C.-A., Lee, J.-F., & Hwang, B.-J. (2010). Chemical dealloying mechanism of bimetallic Pt-Co nanoparticles and enhancement of catalytic activity toward oxygen reduction. Chemistry, 16: 4602-4611. doi: 10.1002/chem.200902263.

  1361. Lazar, S., Etheridge, J., Dwyer, C., Freitag, B., & Botton, G. A. (2010). Applications of spherical aberration correction in STEM and TEM. Microscopy and Microanalysis, 16: 68-69. doi: 10.1017/S1431927610058034.

  1362. Lazar, S., Shao, Y., Gunawan, L., Nechache, R., Pignolet, A., & Botton, G. A. (2010). Imaging, core-loss, and low-loss electron-energy-loss spectroscopy mapping in aberration-corrected STEM. Microscopy and Microanalysis, 16: 416-424. doi: 10.1017/S1431927610013504.

  1363. Lebeau, J. M., Findlay, S. D., Allen, L. J., & Stemmer, S. (2010). Position averaged convergent beam electron diffraction: theory and applications. Ultramicroscopy, 110: 118-125. doi: 10.1016/j.ultramic.2009.10.001

  1364. Li, F. (2010). Microstructural Properties of Semiconductor Nanostructures. Thesis University of Oxford.

  1365. Lichte, H., Linck, M., Geiger, D., & Lehmann, M. (2010). Aberration Correction and Electron Holography. Microscopy and Microanalysis, 16: 434-440. doi: 10.1017/S1431927610093633

  1366. Lim, B., Kobayashi, H., Camargo, P. H. C., Allard, L. F., Liu, J., & Xia, Y. (2010). New insights into the growth mechanism and surface structure of palladium nanocrystals. Nano Research, 3: 180-188. doi: 10.1007/s12274-010-1021-5

  1367. Linck, M., Sickmann, J., Hartel, P., & Muller, H. (2010). New Possibilities for Off-axis Electron Holography by Hardware Aberration Correctors. Microscopy and Microanalysis, 16: 94-95. doi: 10.1017/S1431927610054127.

  1368. Liu, J. & Allard, L. F. (2010). Surface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures. Microscopy and Microanalysis, 16: 425-433. doi: 10.1017/S1431927610000450.

  1369. Lu, N., Wan, Q., & Zhu, J. (2010). Surface Structure of Zigzag SnO 2 Nanobelts. The Journal of Physical Chemistry Letters, 1: 1468-1471. doi: 10.1021/jz100487c.

  1370. Lu, N., Yu, R., Cheng, Z., Dai, Y., Zhang, X., & Zhu, J. (2010). Ferroelectric polarization and domain walls in orthorhombic (K1xNax)NbO3 lead-free ferroelectric ceramics. Applied Physics Letters, 96: 221905. doi: 10.1063/1.3442905.

  1371. Lupini, A. R. & Pennycook, S. J. (2010). Rapid Methods for Dynamic Autotuning. Microscopy and Microanalysis, 16: 244-245. doi: 10.1017/S1431927610059167.

  1372. Lupini, A. R., Wang, P., Nellist, P. D., Kirkland, A. I., & Pennycook, S. J. (2010). Aberration measurement using the Ronchigram contrast transfer function. Ultramicroscopy, 110: 891-898. doi: 10.1016/j.ultramic.2010.04.006

  1373. Majorovits, E., Barton, B., Benner, G., Dietl, C., Kuhlbrandt, W., Lengweiler, S., Mandler, T., Matijevic, M., Niebel, H., & Schroder, R. (2010). Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging. Microscopy and Microanalysis, 16: 534-535. doi: 10.1017/S1431927610057740.

  1374. Mariscal, M. M., Olmos-Asar, J. A., Gutierrez-Wing, C., Mayoral, A., & Yacaman, M. J. (2010). On the atomic structure of thiol-protected gold nanoparticles: a combined experimental and theoretical study. Physical Chemistry Chemical Physics, 12: 11785-11790. doi: 10.1039/C004229C

  1375. Marshall, A. F., Goldthorpe, I. A., Adhikari, H., Koto, M., Wang, Y.-C., Fu, L., Olsson, E., & McIntyre, P. C. (2010). Hexagonal close-packed structure of Au nanocatalysts solidified after Ge nanowire vapor-liquid-solid growth. Nano Letters, 10: 3302-3306. doi: 10.1039/C0CC02983A

  1376. Mayoral, A., Blom, D. A., Mariscal, M. M., Guiterrez-Wing, C., Aspiazu, J., & Jose-Yacaman, M. (2010). Gold clusters showing pentagonal atomic arrays revealed by aberration-corrected scanning transmission electron microscopy. Chemical Communications, 46: 8758-60. doi: 10.1039/C0CC02983A.

  1377. Mayoral, A., Mejia-Rosales, S., Mariscal, M. M., Perez-Tijerina, E., & Jose-Yacaman, M. (2010). The Co-Au interface in bimetallic nanoparticles: a high resolution STEM study. Nanoscale, 2: 2647-2651. doi: 10.1039/C0NR00498G

  1378. Medlin, D. L., Ramasse, Q. M., Spataru, C. D., & Yang, N. Y. C. (2010). Structure of the (0001) basal twin boundary in Bi[sub 2]Te[sub 3]. Journal of Applied Physics, 108: 043517. doi: 10.1063/1.3457902.

  1379. Mehraeen, S., Kulkarni, A., Chi, M., Reed, B. W., Okamoto, N. L., & Gates, B. C. (2010). Structure and Size Determination of the Metal Nanoclusters in the Supported Catalyst: Os3 / MgO by Z-Contrast Imaging. Microscopy and Microanalysis, 16: 1186-1187. doi: 10.1017/S143192761005676X.

  1380. Meyer, D. A., Heintz, J., & Albrecht, R. M. (2010). Detection of Nanoparticles of Differing Composition for High Resolution Labeling. Microscopy and Microanalysis, 16: 992-993. doi: 10.1017/S1431927610062276.

  1381. Mobus, G. (2010). A Simple Autofocus Technique for Aberration Corrected TEM. Microscopy and Microanalysis, 16: 164-165. doi: 10.1017/S1431927610057892.

  1382. Mobus, G. & Saghi, Z. (2010). Single Atom Motion on CeO 2 Nanoparticle Surfaces Imaged by Aberration Corrected HRTEM. Microscopy and Microanalysis, 16: 1452-1453. doi: 10.1017/S1431927610059684.

  1383. Mundy, J. A., Kourkoutis, L. F., Hikita, Y., Hidaka, T., Harold, Y., & Muller, D. A. (2010). Charge Transfer at La 1-x Sr x MnO 3 / SrTiO3 Interfaces Probed by Spectroscopic Imaging in an Aberration-Corrected STEM. Microscopy and Microanalysis, 16: 1398-1399. doi: 10.1017/S1431927610060332.

  1384. Mundy, J. A., Xin, H. L., Cabezas, R., Kourkoutis, L. F., Muller, D. A., Liu, V., Zhang, J., Makharia, R., & Wagner, F. T. (2010). Spectroscopic Imaging of a Statistically Significant Ensemble of Pt-Co Nanoparticles by Aberration Corrected STEM. Microscopy and Microanalysis, 16: 1760-1761. doi: 10.1017/S1431927610058654.

  1385. Nakamura, K., Inada, H., Konno, M., Suzuki, Y., & Kimoto, K. (2010). Minimizing 6-fold symmetry and chromatic aberation by using ultra high resolution lens in CS-corrected STEM. Microscopy and Microanalysis, 16: 136-137. doi: 10.1017/S1431927610056400.

  1386. Neiner, D., Okamoto, N. L., Yu, P., Leonard, S., Condron, C. L., Toney, M. F., Ramasse, Q. M., Browning, N. D., & Kauzlarich, S. M. (2010). Synthesis and characterization of K(8-x)(H2)ySi46. Inorganic Chemistry, 49: 815-822. doi: 10.1021/ic9004592

  1387. Nellist, P. D. & Kirkland, A. I. (2010). Applications of the Oxford-JEOL aberration-corrected electron microscope. Philosophical Magazine, 90: 4751-4767. doi: 10.1080/14786435.2010.516775.

  1388. Nellist, P. D., Wang, P., Behan, G., Kirkland, A. I., Hashimoto, A., & Shimojo, M. (2010). Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy. Microscopy and Microanalysis, 16: 1834-1835. doi: 10.1017/S1431927610057533.

  1389. Nicolopoulos, S., Bultreys, D., Benner, G., Niebel, H., Pavia, G., Gemmi, M., Nts, C., & Strasse, C. Z. (2010). Novel Applications of Zeiss Libra 200 Cs-Corrected TEM with Energy Filtered Precession Electron Diffraction for Structure Determination of Nanocrystals. Microscopy and Microanalysis, 16: 26-27. doi: 10.1017/S1431927610059040.

  1390. Nicolosi, V., Aslam, Z., Kim, J., Krivanek, O. L., Chisholm, M. F., & Pennycook, T. J. (2010). Processing and Aberration- Corrected Imaging of Novel Low-Dimensional Nanostructures. Microscopy and Microanalysis, 16: 76-77. doi: 10.1017/S1431927610054152.

  1391. Nuhfer, N. T., Budruk, A., & De Graef, M. (2010). Aberration-corrected Lorentz microscopy. Microscopy and Microanalysis, 16: 142-143. doi: 10.1017/S1431927610055996.

  1392. Ortalan, V., Uzun, A., Gates, B. C., & Browning, N. D. (2010). Direct imaging of single metal atoms and clusters in the pores of dealuminated HY zeolite. Nature Nanotechnology, 5: 506-510. doi: 10.1038/nnano.2010.92

  1393. Ortalan, V., Uzun, A., Gates, B. C., & Browning, N. D. (2010). Towards full-structure determination of bimetallic nanoparticles with an aberration-corrected electron microscope. Nature Nanotechnology, 5: 843-847. doi: 10.1038/nnano.2010.234

  1394. Oshima, Y., Sawada, H., Hosokawa, F., Okunishi, E., Kaneyama, T., Kondo, Y., Niitaka, S., Takagi, H., Tanishiro, Y., & Takayanagi, K. (2010). Direct imaging of lithium atoms in LiV 2 O 4 by spherical aberration-corrected electron microscopy. Journal of Electron Microscopy, 5: 1-5. doi: 10.1093/jmicro/dfq017.

  1395. Oshima, Y., Sawada, H., Okunishi, E., Kondo, Y., Niitaka, S., & Takagi, H. (2010). Visualization of Lithium Atoms in LiV 2 O 4 by a Spherical Aberration Corrected Electron Microscope. Microscopy and Microanalysis, 16: 162-163. doi: 10.1017/S143192761005703X.

  1396. Ovchinnikov, O. S., Jesse, S., Kalinin, S. V., Chang, H. J., Pennycook, S. J., & Borisevich, A. Y. (2010). Towards the Thinking Microscope. Microscopy and Microanalysis, 16: 160-161. doi: 10.1017/S1431927610062720.

  1397. Pande, K., Lazarov, V. K., & Weinert, M. (2010). Atomic and Electronic Structure of Polar Fe2O3/MgO Interface. Microscopy and Microanalysis, 16: 1474-1475. doi: 10.1017/S143192761006215X.

  1398. Park, G.-S., Lee, J. H., Heo, S., Kwon, H., Park, J., & Keun, S. (2010). High Density of Si Nanodots in Silicon Oxide Nanowires by Electron Beam. Microscopy and Microanalysis, 16: 1736-1737. doi: 10.1017/S1431927610053730.

  1399. Patrick, B. N., Allard, L. F., Shao-Horn, Y., & Ferreira, P. J. (2010). Aberration-Corrected STEM Image Simulation of Segregation in Pt 3 Co Nanoparticles for PEM Fuel Cells. Microscopy and Microanalysis, 16: 252-253. doi: 10.1017/S1431927610061908.

  1400. Pennycook, S. J., Borisevich, A. Y., Varela, M., Lupini, A. R., Chang, H. J., Leonard, D. N., Pennycook, T. J., Oxley, M. P., Idrobo, J. C., Yurdakul, H., Turan, S., Yu, P., Ramesh, R., & Pantelides, S. T. (2010). Interface Structure-Property Relations through Aberration-Corrected STEM. Microscopy and Microanalysis, 16: 1420-1421. doi: 10.1017/S1431927610059787.

  1401. Pennycook, T. J., Varela, M., Beck, M. J., Bruno, F. Y., Leon, C., Santamaria, J., Pantelides, S. T., & Pennycook, S. J. (2010). Strain-Enhanced Ionic Conductivity. Microscopy and Microanalysis, 16: 100-101. doi: 10.1017/S1431927610061921.

  1402. Pyrz, W. D., Blom, D. A., Sadakane, M., Kodato, K., Ueda, W., Vogt, T., & Buttrey, D. J. (2010). Atomic-level imaging of Mo-V-O complex oxide phase intergrowth, grain boundaries, and defects using HAADF-STEM. Proceedings of the National Academy of Sciences of the United States of America, 107: 6152-6157. doi: 10.1073/pnas.1001239107

  1403. Ross, I. M., Rainforth, W. M., Seabourne, C. R., Scott, A. J., Wang, P., Mendis, B. G., Bleloch, A. L., Reinhard, C., & Hovsepian, P. (2010). Electron energy loss spectroscopy of nano-scale CrAlYN/CrN–CrAlY(O)N/Cr(O)N multilayer coatings deposited by unbalanced magnetron sputtering. Thin Solid Films, 518: 5121-5127. doi: 10.1016/j.tsf.2010.03.012

  1404. Rossell, M. D., Ramasse, Q. M., Erni, R., Yang, C., & Ramesh, R. (2010). Atomic Configuration of Planar Defects in Multiferroic Ca-doped BiFeO 3 Films. Microscopy and Microanalysis, 16: 96-97. doi: 10.1017/S1431927610055868.

  1405. Rossouw, D., Mirkovic, T., Scholes, G. D., & Botton, G. A. (2010). TEM Analysis of EuS/CdSe Nano Heterostructures. Microscopy and Microanalysis, 16: 1292-1293. doi: 10.1017/S1431927610062951.

  1406. Rouviere, J. L., Lancon, F., Rousseau, K., Caliste, D., Jouneau, P. H., & Fournel, F. (2010). Structure of an incommensurate 90 Si grain boundary resolved with the help of a Cs-corrector for illumination. Journal of Physics: Conference Series, 209: 012041. doi: 10.1016/j.ultramic.2010.06.008.

  1407. Sader, K., Brown, A., Brydson, R., & Bleloch, A. (2010). Quantitative analysis of image contrast in phase contrast STEM for low dose imaging. Ultramicroscopy, 110: 1324-1331.

  1408. Saitoh, K., Tatara, Y., & Tanaka, N. (2010). Atom-column distinction by Kikuchi pattern observed by an aberration-corrected convergent electron probe. Journal of electron microscopy, 59: 387-94. doi: 10.1093/jmicro/dfq015.

  1409. Sales, D. L., Varela, M., Pennycook, S. J., Galindo, P. L., Gonzalez, L., Gonzalez, Y., Fuster, D., & Molina, S. I. (2010). Morphological evolution of InAs/InP quantum wires through aberration-corrected scanning transmission electron microscopy. Nanotechnology, 21: 325706. doi: 10.1088/0957-4484/21/32/325706.

  1410. Sarahan, M. C., Ramasse, Q. M., & Browning, N. D. (2010). Data Processing Techniques for Aberration-Corrected STEM. Rossell, Marta-Dacil, 16: 112-113. doi: 10.1017/S1431927610055327.

  1411. Shah, A. B., Ramasse, Q. M., Zhai, X., Wen, J. G., May, S. J., Petrov, I., Bhattacharya, A., Abbamonte, P., Eckstein, J. N., & Zuo, J.-M. (2010). Probing interfacial electronic structures in atomic layer LaMnO(3) and SrTiO3 superlattices. Advanced materials, 22: 1156-60. doi: 10.1002/adma.200904198.

  1412. Shah, A. B., Zuo, J. M., Ramasse, Q. M., Wen, J. G., Zhai, X., & Bhattacharya, A. (2010). Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS. Microscopy and Microanalysis, 16: 1394-1395. doi: 10.1017/S143192761005631X.

  1413. Sivaramakrishnan, S., Wen, J., Scarpelli, M. E., Pierce, B. J., & Zuo, J.-M. (2010). Equilibrium shapes and triple line energy of epitaxial gold nanocrystals supported on TiO2(110). Physical Review B, 82: 195421. doi: 10.1103/PhysRevB.82.195421.

  1414. Soultanidis, N., Zhou, W., Psarras, A. C., Gonzalez, A. J., Iliopoulou, E. F., Kiely, C. J., Wachs, I. E., & Wong, M. S. (2010). Relating n-pentane isomerization activity to the tungsten surface density of WO(x)/ZrO2. Journal of the American Chemical Society, 132: 13462-13471. doi: 10.1021/ja105519y

  1415. Spiecker, E., Garbrecht, M., Jager, W., & Tillmann, K. (2010). Advantages of aberration correction for HRTEM investigation of complex layer compounds. Journal of microscopy, 237: 341-6. doi: 10.1111/j.1365-2818.2009.03257.x.

  1416. Srinivasan, R., Banerjee, R., Viswanathan, G. B., Nag, S., Hwang, J. Y., Tiley, J., & Fraser, H. L. (2010). The use of advanced characterization to study transitions across solid state interfaces. JOM, 62: 64-69. doi: 10.1007/s11837-010-0183-7

  1417. Su, D. & Zhu, Y. (2010). Scanning moire fringe imaging by scanning transmission electron microscopy. Ultramicroscopy, 110: 229-33. doi: 10.1016/j.ultramic.2009.11.015.

  1418. Sun, K. (2010). Cs-corrected STEM Study of Structure and Chemistry of Au/Ni/GaAs, Au/Cu/CdTe and Pt/YSZ Interfaces. Microscopy and Microanalysis, 16: 1456-1457. doi: 10.1017/S1431927610060228.

  1419. Takeguchi, M., Okuda, M., Hashimoto, A., Mitsuishi, K., Shimojo, M., Zhang, X., Wang, P., Nellist, P. D., & Kirkland, A. I. (2010). Three dimensional characterization of a silica hollow sphere with an iron oxide core by annular dark field scanning confocal electron microscopy. Microscopy and Microanalysis, 16: 1836-1837. doi: 10.1017/S143192761005885X.

  1420. Thron, A. M., Greene, P., Liu, K., & Van Benthem, K. (2010). Atomic Level Mechanisms of Solid-State Dewetting in Thin Metal Films Deposited on Silicon (100) Substrates. Microscopy and Microanalysis, 16: 1462-1463. doi: 10.1017/S1431927610061258.

  1421. Uzun, A., Ortalan, V., Browning, N. D., & Gates, B. C. (2010). A site-isolated mononuclear iridium complex catalyst supported on MgO: Characterization by spectroscopy and aberration-corrected scanning transmission electron microscopy. Journal of Catalysis, 269: 318-328. doi: 10.1016/j.jcat.2009.11.017.

  1422. Vajargah, S. H., Couillard, M., Shao, Y., Tavakoli, S., Kleiman, R., & Preston, J. S. (2010). Aberration-corrected TEM Study of Defects in III-V Films Grown on Si. Microscopy and Microanalysis, 16: 1138-1139. doi: 10.1017/S1431927610062033.

  1423. Vallet-Regi, M., Manzano, M., Gonzalez-Calbet, J. M., & Okunishi, E. (2010). Evidence of drug confinement into silica mesoporous matrices by STEM spherical aberration corrected microscopy. Chemical Communications, 46: 2956-2958. doi: 10.1039/C000806K

  1424. van Benthem, K., Bonifacio, C. S., Thron, A. M., Weil, S. M., & Holland, T. B. (2010). Investigation of Dielectric Breakdown on the Atomic Length-scale Using In situ STM-TEM. Microscopy and Microanalysis, 16: 1750-1751. doi: 10.1017/S1431927610061106.

  1425. Walkosz, W., Klie, R. F., Out, S., Mikijelj, B., Pennycook, S. J., Pantelides, S. T., & Idrobo, J. C. (2010). Crystal-induced effects at crystal/amorphous interfaces: The case of Si f3gN f4g/SiO f2g. Physical Review B, 82: 081412. doi: 10.1103/PhysRevB.82.081412.

  1426. Walton, J. K., Rouvimov, S., & Solanki, R. (2010). High Resolution Electron Microscopy of CdSSe Nanowires. Microscopy and Microanalysis, 16: 1390-1391. doi: 10.1017/S1431927610062707.

  1427. Wang, D., Suffner, J., Kuebel, C., & Hahn, H. (2010). Characterization of Metastable ZrO2-Y2O3-Al2O3 Mixed Nanocrystals. Microscopy and Microanalysis, 16: 1656-1567. doi: 10.1017/S1431927610056564.

  1428. Wang, D., Villa, A., Spontoni, P., Su, D. S., & Prati, L. (2010). In situ formation of Au-Pd bimetallic active sites promoting the physically mixed monometallic catalysts in the liquid-phase oxidation of alcohols. Chemistry, 16: 10007-10013. doi: 10.1002/chem.201001330

  1429. Wang, P., Behan, G., Kirkland, A. I., & Nellist, P. D. (2010). Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope. Journal of Physics: Conference Series, 241: 012012. doi: 10.1088/1742-6596/241/1/012012.

  1430. Wang, Z. W., Abdela, A., Yin, F., & Palmer, R. E. (2010). Three-Dimensional Atomic Structure and Surface Dynamics of Size-Selected Au923 Clusters. Microscopy and Microanalysis, 16: 1646-1647. doi: 10.1017/S143192761005912X.

  1431. Wang, Z. W., Toikkanen, O., Quinn, B. M., Akola, J., Lopez-Acevedo, O., Hakkinen, H., & Palmer, R. E. (2010). Probing the Atomic-scale Structure of Monolayer-Protected Au 38 Clusters. Microscopy and Microanalysis, 16: 1652-1653. doi: 10.1017/S1431927610059283.

  1432. Wang, Z. W., Yin, F., Bruma, A., & Palmer, R. E. (2010). Can We Solve the Atomic Structure of Small Au clusters by HAADF-STEM? Microscopy and Microanalysis, 16: 148-149. doi: 10.1017/S1431927610059234.

  1433. Watanabe, M., Okunishi, E., & Aoki, T. (2010). Atomic-Level Chemical Analysis by EELS and XEDS in Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 16: 66-67. doi: 10.1017/S1431927610057764.

  1434. Weil, S. M., Wang, J., Tracy, J. B., & van Benthem, K. (2010). Determination of Local Oxidations States in Ni-NiO Core-shell Structures Using White Line Intensity Ratios. Microscopy and Microanalysis, 16: 1458-1459. doi: 10.1017/S1431927610060411.

  1435. Wen, J., Mabon, J., Lei, C., Burdin, S., Sammann, E., Petrov, I., Shah, A. B., Chobpattana, V., Zhang, J., Ran, K., Zuo, J.-M., Mishina, S., & Aoki, T. (2010). The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois. Microscopy and Microanalysis, 16: 183-193. doi: 10.1017/S1431927610000085.

  1436. Xin, H. L., Kourkoutis, L. F., Mundy, J. A., Zheng, H., & Muller, D. A. (2010). Atomic-Scale EELS Maps: It s Not Resolution, but Contrast. Microscopy and Microanalysis, 16: 242-243. doi: 10.1017/S1431927610061623.

  1437. Xin, H. L. & Muller, D. A. (2010). Three-Dimensional Imaging in Aberration-Corrected Electron Microscopes. Microscopy and Microanalysis, 16: 445-455. doi: 10.1017/S1431927610093360

  1438. Xin, H. L., Mundy, J. A., Cabezas, R., Kourkoutis, L. F., Muller, D. A., Liu, V., Zhang, J., Subramanian, N., Makharia, R., & Wagner, F. T. (2010). One Million EEL Spectra Acquisition with Aberration-Corrected STEM: 2-D Chemical Investigation of a Statistically Significant Ensemble of Nanocatalysts. Microscopy and Microanalysis, 16: 104-105. doi: 10.1017/S143192761006109X.

  1439. Yamazaki, T., Kotaka, Y., Tsukada, M., & Kataoka, Y. (2010). Study of atomic resolved plasmon-loss image by spherical aberration-corrected STEM-EELS method. Ultramicroscopy, 110: 1161-1165. doi: 10.1016/j.ultramic.2010.04.011

  1440. Yan, W., Herzing, A. A., Kiely, C. J., & Zhang, W.-X. (2010). Nanoscale zero-valent iron (nZVI): aspects of the core-shell structure and reactions with inorganic species in water. Journal of Contaminant Hydrology, 118: 96-104. doi: 10.1016/j.jconhyd.2010.09.003

  1441. Yi, F., Hwang, J., Imhoff, S., Perepezko, J., & Voyles, P. (2010). STEM Fluctuation Microscopy Characterization of an Amorphous Protocrystalline Metal Glass Nanocomposite. Microscopy and Microanalysis, 16: 1644-1645. doi: 10.1017/S1431927610056618.

  1442. Yi, F., Tiemeijer, P., & Voyles, P. M. (2010). Flexible formation of coherent probes on an aberration-corrected STEM with three condensers. Journal of Electron Microscopy, 59: S15-S21. doi: 10.1093/jmicro/dfq052

  1443. Yoshida, K., Shute, C., Boyes, E. D., Gai, P. L., & Weertman, J. R. (2010). Aberration-Corrected Electron Microscopy Studies of Novel Nanostructures in Highly Aligned Nano-twinned Metals. Microscopy and Microanalysis, 16: 1566-1567. doi: 10.1017/S1431927610058344.

  1444. Yoshida, K., Thomas, J. M., Boyes, E. D., & Midgley, P. A. (2010). Aberration-Corrected HAADF-STEM Studies of Nano-Gold / Titania Catalysts. Microscopy and Microanalysis, 16: 1201-1202. doi: 10.1017/S1431927610058332.

  1445. Young, N. P., van Huis, M. A., Zandbergen, H. W., Xu, H., & Kirkland, A. I. (2010). Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy. Ultramicroscopy, 110: 506-516. doi: 10.1016/j.ultramic.2009.12.010.

  1446. Yu, R., Hu, L. H., Cheng, Z. Y., Li, Y. D., Ye, H. Q., & Zhu, J. (2010). Direct subangstrom measurement of surfaces of oxide particles. Physical Review Letters, 105: 226101. doi: 10.1103/PhysRevLett.105.226101

  1447. Yu, W. & Mader, W. (2010). Displacement field measurement of metal sub-lattice in inversion domains of indium-doped zinc oxide. Ultramicroscopy, 110: 411-417. doi: 10.1016/j.ultramic.2009.11.023

  1448. Zandbergen, H. W., Song, B., Rudneva, M., & van Huis, M. A. (2010). In situ High Resolution Electron Microscopy. Microscopy and Microanalysis, 16: 308-309. doi: 10.1017/S1431927610062987.

  1449. Zhang, L., Xia, G., Yang, Y., Heldebrant, D., King, D., Wang, Y., & Allard, L. F. (2010). Morphological and Electronic Structure of Pt-Re Nanoparticles Supported on Carbon under Activation and Reaction Conditions for Aqueous-Phase Reforming of Bioliquid. Microscopy and Microanalysis, 16: 1428-1429. doi: 10.1017/S1431927610060307.

  1450. Zhang, Z., Rashkova, B., Dehm, G., Lazar, P., Redinger, J., & Podloucky, R. (2010). Unveiling the atomic and electronic structure of the VN/MgO interface. Physical Review B, 82: 060103. doi: 10.1103/PhysRevB.82.060103.

  1451. Zhou, H., Chisholm, M. F., Pant, P., Gazquez, J., Pennycook, S. J., & Narayan, J. (2010). Atomic Resolution Z-Contrast Imaging of the Interface Between Non-Polar a-ZnO Grown on r-Cut Al2O3 by Pulsed Laser Deposition. Microscopy and Microanalysis, 16: 154-155. doi: 10.1017/S1431927610061349.

  1452. Zhou, W., Ross-Medgaarden, E. I., Doura, K. F., Watanabe, M., Wachs, I. E., & Kiely, C. J. (2010). Revealing Structure-Activity Relationships in Model Double-Supported WO3/TiO2/SiO2 Solid Acid Catalysts by Atomic Scale Characterization. Microscopy and Microanalysis, 16: 1446-1447. doi: 10.1017/S1431927610057016.

  1453. Zhou, W., Soultanidis, N., Wachs, I. E., Wong, M. S., & Kiely, C. J. (2010). Revealing Structure-Activity Relationships in Supported WO3/ZrO2 Solid Acid Catalysts using Aberration Corrected High Angle Annular Dark Field Imaging. Microscopy and Microanalysis, 16: 1184-1185. doi: 10.1017/S1431927610056977.

  1454. Zhou, W.-P., Sasaki, K., Su, D., Zhu, Y., Wang, J. X., & Adzic, R. R. (2010). Gram-Scale-Synthesized Pd 2 Co-Supported Pt Monolayer Electrocatalysts for Oxygen Reduction Reaction. The Journal of Physical Chemistry C, 114: 8950-8957. doi: 10.1021/jp100283p

  1455. Zhu, Y., Inada, H., Su, D., Wu, L., Ciston, J., Jooss, C. H., Norpoth, J., & Wall, J. (2010). Imaging and Spectroscopy of Interfaces and Surfaces with Advanced Electron Microscopy. Microscopy and Microanalysis, 16: 1430-1431. doi: 10.1017/S1431927610059453.

  1456. 2009


  1457. Abe, E., Seki, T., & Pennycook, S. (2009). Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-Contrast STEM. Microscopy and Microanalysis, 15: 772. doi: 10.1017/S1431927609095415.

  1458. Abe, Y., Tanaka, T., Sawada, H., Okunishi, E., Kondo, Y., Tanishiro, Y., & Takayanagi, K. (2009). Electron Energy Loss Spectroscopy of Graphene Identified by Aberration Corrected TEM at 300kV. Microscopy and Microanalysis, 15: 1484-1485. doi: 10.1017/S1431927609097.

  1459. Allard, L., Borisevich, A., Deng, W., Si, R., Flytzani-Stephanopoulos, M., & Overbury, S. (2009). Behavior of Au Species in Au/FeOx Catalysts as a Result of In-Situ Thermal Treatments, Characterized via Aberration-Corrected STEM Imaging. Microscopy and Microanalysis, 15: 1482-1483. doi: 10.1017/S1431927609097001.

  1460. Allard, L. F., Bigelow, W. C., Jose-Yacaman, M., Nackashi, D. P., Damiano, J., & Mick, S. E. (2009). A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures. Microscopy research and technique, 72: 208-15. doi: 10.1002/jemt.20673.

  1461. Allard, L. F., Borisevich, A., Deng, W., Si, R., Flytzani-Stephanopoulos, M., & Overbury, S. H. (2009). Evolution of gold structure during thermal treatment of Au/FeOx catalysts revealed by aberration-corrected electron microscopy. Journal of electron microscopy, 58: 199-212. doi: 10.1093/jmicro/dfp016.

  1462. Allard, L. F., More, K. L., Liu, J. J., & Louis, S. (2009). Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures. Microscopy and Microanalysis, 15: 130-131. doi: 10.1017/S143192760909.

  1463. Alloyeau, D., Freitag, B., Dag, S., Wang, L. W., & Kisielowski, C. (2009). Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy. Physical Review B, 80: 1-6. doi: 10.1103/PhysRevB.80.014114.

  1464. Asoro, M., Shao-Horn, Y., Kovar, D., Allard, L., & Ferreira, P. (2009). Determination of Sintering Parameters from In-Situ Aberration-Corrected STEM Imaging of Coalescence in Pt Nanoparticles. Microscopy and Microanalysis, 15: 730. doi: 10.1017/S1431927609096913.

  1465. Bangert, U., Gass, M. H., Bleloch, A. L., Nair, R. R., & Geim, A. K. (2009). Manifestation of ripples in free-standing graphene in lattice images obtained in an aberration-corrected scanning transmission electron microscope. Physica Status Solidi A, 206: 1117-1122. doi: 10.1002/pssa.200824453.

  1466. Batson, P. E. (2009). Control of parasitic aberrations in multipole optics. Journal of electron microscopy, 58: 123-30. doi: 10.1093/jmicro/dfp015.

  1467. Behan, G., Cosgriff, E. C., Kirkland, A. I., & Nellist, P. D. (2009). Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope. Philosophical Transactions of the Royal Society A, 367: 3825-44. doi: 10.1098/rsta.2009.0074.

  1468. Bell, D., Schillinger, R., Meyer, S., & Tayebati, P. (2009). Correlative Microscopy: Progress in Simultaneous Atomic-column XEDS and EELS, using a Monochromated, Aberration-corrected STEM. Microscopy and Microanalysis, 15: 472-473. doi: 10.1017/S1431927609097323.

  1469. Bell, D. C., Meyer, S., Orchowski, A., Tayebati, P., & Benner, G. (2009). Aberration-Correction in a Monochromated and Energy Filtered Environment. Microscopy and Microanalysis, 15: 1490-1491. doi: 10.1017/S143192760909.

  1470. Blom, D. A., Pyrz, W. D., Vogt, T., & Buttrey, D. J. (2009). Aberration-corrected STEM investigation of the M2 phase of MoVNbTeO selective oxidation catalyst. Journal of electron microscopy, 58: 193-8. doi: 10.1093/jmicro/dfn025.

  1471. Bonifacio, C. S., Thron, A. M., Pennycook, S. J., Contescu, C. I., Gallego, N. C., & Van Benthem, K. (2009). Atomic Resolution Investigation of metal-Assisted Hydrogen Storage Mechanisms in Activated Carbon Fibers. Microscopy and Microanalysis, 15: 1426-1427. doi: 10.1017/S1431927609.

  1472. Borisevich, A., Kalinin, S., Lupini, A., Jesse, S., Chang, H., Hujiben, M., Ramesh, R., & Pennycook, S. (2009). Using Neural Network Algorithms for Compositional Mapping in STEM EELS. Microscopy and Microanalysis, 15: 450-451. doi: 10.1017/S1431927609097967.

  1473. Bowers, M. J., McBride, J. R., Garrett, M. D., Sammons, J. A., Dukes, A. D., Schreuder, M. A., Watt, T. L., Lupini, A. R., Pennycook, S. J., & Rosenthal, S. J. (2009). Structure and ultrafast dynamics of white-light-emitting CdSe nanocrystals. Journal of the American Chemical Society, 131: 5730-1. doi: 10.1021/ja900529h.

  1474. Bradley, J. P. & Dai, Z. R. (2009). Analytical SuperSTEM for extraterrestrial materials research. Meteoritics Planetary Science, 44: 1627-1642. doi: 10.1111/j.1945-5100.2009.tb01195.x.

  1475. Buban, J. P., Miaofang, C., Masiel, D. J., Bradley, J. P., Jiang, B., Stahlberg, H., & Browning, N. D. (2009). Structural variability of edge dislocations in a SrTiO3 low-angle [001] tilt grain boundary. Journal of Materials Research, 24: 2191-2199. doi: 10.1557/JMR.2009.0259.

  1476. Cerchiara, R. R., Fischione, P. E., Liu, J., Matesa, J. M., Robins, A. C., Fraser, H. L., Genc, A., Instruments, E. A. F., Vaalsbroek, K., Cooper, D., & Hetherington, C. (2009). Nanomilling for Aberration Corrected TEM and HAADF STEM. Microscopy and Microanalysis, 15: 1520-1521. doi: 10.1017/S1431927609.

  1477. Chang, H., Borisevich, A., Balke, N., Kalinin, S., Ramesh, R., Huijben, M., & Pennycook, S. (2009). Interfacial Structure in Multiferroic BiFeO3 Thin Films. Microscopy and Microanalysis, 15: 1028-1029. doi: 10.1017/S1431927609092903.

  1478. Chang, L.-Y., Lazar, S., Baranova, E., Bock, C., & Botton, G. (2009). Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM. Microscopy and Microanalysis, 15: 1416-1417. doi: 10.1017/S1431927609094744.

  1479. Chang, L.-Y., Lazar, S., Bartova, B., Botton, G. A., Hebert, C., & Fontcuberta i Morral, A. (2009). Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration. Microscopy and Microanalysis, 15: 138-139. doi: 10.1017/S1431927609096470.

  1480. Chen, S., Sheng, W., Yabuuchi, N., Ferreira, P. J., Allard, L. F., & Shao-Horn, Y. (2009). Origin of Oxygen Reduction Reaction Activity on "Pt3Co"Nanoparticles: Atomically Resolved Chemical Compositions and Structures. The Journal of Physical Chemistry C, 113: 1109-1125. doi: 10.1021/jp807143e

  1481. Chisholm, M. F., Lee, H. N., Luo, W., & Pantelides, S. T. (2009). Simultaneous Z-contrast / phase contrast imaging of ferroelectric thin films. Microscopy and Microanalysis, 15: 1464-1465. doi: 10.1017/S143192760909743.

  1482. Ciston, J. W. (2009). Crystallographic perturbations to valence charge density and hydrogen-surface interactions. ProQuest Dissertations and Theses.

  1483. Colliex, C., Brun, N., Gloter, A., Imhoff, D., Kociak, M., March, K., Mory, C., Stephan, O., Tence, M., & Walls, M. (2009). Multi-dimensional and multi-signal approaches in scanning transmission electron microscopes. Philosophical Transactions of the Royal Society - Series A: Mathematical, Physical and Engineering Sciences, 367: 3845-3858. doi: 10.1098/rsta.2009.0128

  1484. Erni, R., Rossell, M. D., Kisielowski, C., & Dahmen, U. (2009). Atomic-resolution imaging with a sub-50-pm electron probe. Physical Review Letters, 102: 096101. doi: 10.1103/PhysRevLett.102.096101

  1485. Falqui, A., Corrias, A., Gass, M., & Mountjoy, G. (2009). A Transmission Electron Microscopy Study of Fe-Co Alloy Nanoparticles in Silica Aerogel Matrix Using HREM, EDX, and EELS. Microscopy and Microanalysis, 15: 114-124. doi: 10.1017/S1431927609090114

  1486. Fitting Kourkoutis, L., Song, J., Hwang, H., & Muller, D. (2009). Atomic-Scale Chemical Imaging of Interdiffusion and Defects in (La0.7Sr0.3MnO3)5/(SrTiO3)5 Multilayers by Aberration Corrected Microscopy. Microscopy and Microanalysis, 15: 428-429. doi: 10.1017/S1431927609094161.

  1487. Freitag, B., Bischoff, M., Mueller, H., Hartel, P., & Harrach, H. S. V. (2009). Sub-nanometer resolution in field-free imaging using a Titan80-300 with Lorentz lens and image Cs-corrector at 300kV acceleration voltage. Microscopy and Microanalysis, 15: 184-185. doi: 10.1017/S143192760909429.

  1488. Furuya, K., Iakoubovskii, K., Mitsuishi, K., Donnelly, S., & Song, M. (2009). Interfaces of Xe Inclusions Ion-implanted in Al - Ordering in a Fluid Xe and Matrix Oxidation at Surfaces. Microscopy and Microanalysis, 15: 1360-1361. doi: 10.1017/S1431927609099577.

  1489. Gai, P. L. & Boyes, E. D. (2009). Advances in atomic resolution in situ environmental transmission electron microscopy and 1A aberration corrected in situ electron microscopy. Microscopy Research and Technique, 72: 153-164. doi: 10.1002/jemt.20668

  1490. Gazquez, J., Varela, M., Oxley, M. P., Luo, W., Pantelides, S. T., Torija, M. A., Sharma, M., Leighton, C., & Pennycook, S. J. (2009). Structural and Chemical Details of La05Sr0.5CoO3-δ Thin Films. Microscopy and Microanalysis, 15: 440-441. doi: 10.1017/S14319276090943.

  1491. Genc, A., Banerjee, R., Thompson, G. B., Maher, D. M., Johnson, A. W., & Fraser, H. L. (2009). Complementary techniques for the characterization of thin film Ti/Nb multilayers. Ultramicroscopy, 109: 1276-81. doi: 10.1016/j.ultramic.2009.05.015.

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  1673. Varela, M., Christen, H. M., Lee, H. N., Petit, L., Schulthess, T., Pennycook, S. J., Luo, W., Pantelides, S., Garcia-Barriocanal, J., Leon, C., & Santamaria, J. (2008). Oxide Interfaces Under the Electron Microscope. Microscopy and Microanalysis, 14: 1346-1347. doi: 10.1017/S1431927608086194.

  1674. Walkosz, W., Klie, R., Ogut, S., Borisevich, A., Becher, P., Pennycook, S. J., & Idrobo, J. C. (2008). Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods. Microscopy and Microanalysis, 14: 1364-1365. doi: 10.1017/S1431927608085668.

  1675. Wang, J., Allard, L. F., Fraundorf, P., Howe, J., & Liu, J. (2008). Study of Au Nanoparticle Catalyzed Growth Processes of ZnO Nanowires. Microscopy and Microanalysis, 14: 200-201. doi: 10.1017/S1431927608086091.

  1676. Wang, P., DAlfonso, A., Findlay, S., Allen, L., & Bleloch, A. (2008). Contrast Reversal in Atomic-Resolution Chemical Mapping. Physical Review Letters, 101: 236102. doi: 10.1103/PhysRevLett.101.236102.

  1677. Wang, P., Gass, M., Falke, M., & Bleloch, A. (2008). Performance of a Nion Co. UltraSTEM. Microscopy and Microanalysis, 14: 1376-1377. doi: 10.1017/S1431927608086005.

  1678. Watanabe, M., Kanno, M., Ackland, D., Kiely, C., & Williams, D. (2008). Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 14: 1400-1401. doi: 10.1017/S1431927608088569

  1679. Xin, H. L., Intaraprasonk, V., & Muller, D. A. (2008). Controlling Channeling Effects in Aberration-Corrected STEM Tomography. Microscopy and Microanalysis, 14: 926-927. doi: 10.1017/S1431927608086054.

  1680. Xin, H. L., Intaraprasonk, V., & Muller, D. A. (2008). Depth sectioning of individual dopant atoms with aberration-corrected scanning transmission electron microscopy. Applied Physics Letters, 92: 013125. doi: 10.1063/1.2828990.

  1681. Xin, Y., Allard, L. F., & Mao, Z. Q. (2008). Ultrastructure of a Metal/Superconductor Interface Revealed by Atomic-Resolution STEM Techniques. Microscopy and Microanalysis, 14: 1388-1389. doi: 10.1017/S1431927608087126.

  1682. Yamasaki, J., Kawai, T., Kondo, Y., & Tanaka, N. (2008). A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM. Microscopy and Microanalysis, 14: 27-35. doi: 10.1017/S1431927608080173

  1683. Yang, G., Ramasse, Q., & Klie, R. (2008). Direct measurement of charge transfer in thermoelectric Ca3Co4O9. Physical Review B, 78: 2-5. doi: 10.1103/PhysRevB.78.153109.

  1684. Yang, G., Zhao, Y., Sader, K., Bleloch, A., & Klie, R. F. (2008). Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 14: 436-437. doi: 10.1017/S1431927608083499.

  1685. Zhou, W., Ross-Medgaarden, E., Wachs, I. E., & Kiely, C. J. (2008). Structural Characterization of WO3/ZrO2 Catalysts using HAADF Imaging. Microscopy and Microanalysis, 14: 1350-1351. doi: 10.1017/S1431927608083402.

  1686. 2007


  1687. Batson, P. (2007). Au Cluster Behavior Using Aberration Corrected ADF Imaging. Microscopy and Microanalysis, 13: 858-859. doi: 10.1017/S1431927607076325.

  1688. Benami, A., Santana, G., Ortiz, A., Ponce, A., Romeu, D., Aguilar-Hernandez, J., Contreras-Puente, G., & Alonso, J. C. (2007). Strong white and blue photoluminescence from silicon nanocrystals in SiN x grown by remote PECVD using SiCl 4 /NH 3. Nanotechnology, 18: 155704. doi: 10.1088/0957-4484/18/15/155704.

  1689. Blom, D., Allard, L., Narula, C., & Moses, M. (2007). Aberration-Corrected STEM ex-situ Studies of Catalysts. Microscopy and Microanalysis, 13: 1192-1193. doi: 10.1017/S1431927607078269.

  1690. Blom, D., Bradley, S., Sinkler, W., & Allard, L. (2007). Studies of Cluster Evolution During Reduction of Pt/Alumina Catalysts. Microscopy and Microanalysis, 13: 868-869. doi: 10.1017/S1431927607077641.

  1691. Borisevich, A., Sohlberg, K., Caldararu, M., Pantelides, S., & Pennycook, S. (2007). Structure-Properties Relationships in SnO2/Al2O3 and Pt/SnO2/Al2O3 Catalysts. Microscopy and Microanalysis, 13: 570-571. doi: 10.1017/S143192760707746X.

  1692. Bosman, M., Keast, V. J., Garcia-Munoz, J. L., D'Alfonso, A. J., Findlay, S. D., & Allen, L. J. (2007). Two-dimensional mapping of chemical information at atomic resolution. Physical Review Letters, 99: 086102. doi: 10.1103/PhysRevLett.99.086102

  1693. Browning, N., Arslan, I., Bradley, J., Chi, M., Dai, Z., Erni, R., Herrera, M., Okamoto, N., & Ramasse, Q. (2007). Aberration Corrected and Monochromated STEM/TEM for Materials Science. Microscopy and Microanalysis, 13: 1180-1181. doi: 10.1017/S1431927607079123.

  1694. Chang, L. Y., Cervera-Gontard, L., Hetherington, C., Kirkland, A. I., Ozkaya, D., & Dunin-Borkowski, R. (2007). Imaging active sites on platinum catalytic nanoparticles using aberration-corrected electron microscope. Microscopy and Microanalysis, 13: 866-867. doi: 10.1017/S1431927607072947.

  1695. Chisholm, M., Shibata, N., Nakamura, A., Pennycook, S., Yamamoto, T., & Ikuhara, Y. (2007). Imaging Non-stoichiometric Dislocation Cores in Alumina. Microscopy and Microanalysis, 13: 1174-1175. doi: 10.1017/S1431927607078336.

  1696. Cox, G. (2007). From fuel cells to catalysts - new insights into chemical materials by electron microscopy. Microscopy and Microanalysis, 13: 378-379. doi: 10.1017/S1431927607081895

  1697. D'Alfonso, A. J., Findlay, S. D., Oxley, M. P., Pennycook, S. J., van Benthem, K., & Allen, L. J. (2007). Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy. Ultramicroscopy, 108: 17-28. doi: 10.1016/j.ultramic.2007.02.026.

  1698. Dillon, S. J. & Harmer, M. P. (2007). Direct observation of multilayer adsorption on alumina grain boundaries. Journal of the American Ceramic Society, 90: 996-998. doi: 10.1111/j.1551-2916.2007.01512.x.

  1699. Dwyer, C., Hartel, P., Muller, H., Haider, M., & Kirkland, A. (2007). Uses of a STEM Cs-Corrector in Electron Diffractive Imaging. Microscopy and Microanalysis, 13: 958-959. doi: 10.1017/S1431927607073989.

  1700. Dwyer, C., Kirkland, A. I., Hartel, P., Muller, H., & Haider, M. (2007). Electron nanodiffraction using sharply focused parallel probes. Applied Physics Letters, 90: 151104. doi: 10.1063/1.2721120.

  1701. Evans, J., Hetherington, C., Kirkland, A., Stahlberg, H., & Browning, N. (2007). Cs-Corrected Cryo-Electron Microscopy for Biological Samples. Microscopy and Microanalysis, 13: 1164-1165. doi: 10.1017/S1431927607078713.

  1702. Ferrer, D., Blom, D. A., Allard, L. F., Division, T., & Ridge, O. (2007). High resolution electron microscopy of bimetallic nanoparticles. Microscopy and Microanalysis, 13: 84-85. doi: 10.1017/S14319276070795.

  1703. Fraser, H. L., Genc, A., Nag, S., & Banerjee, R. (2007). Use of Dark-field STEM Imaging to Reveal Phase Separation in a - Stabilized Titanium Alloy. Microscopy and Microanalysis, 13: 1200-1201. doi: 10.1017/S1431927607079317.

  1704. Gontard, L. C., Chang, L.-Y., Hetherington, C. J. D., Kirkland, A. I., Ozkaya, D., & Dunin-Borkowski, R. E. (2007). Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. Angewandte Chemie International Edition, 46: 3683-3685. doi: 10.1002/ange.200604811

  1705. Haigh, S., Kirkland, A., & Chang, L. (2007). Aberration Corrected Tilt Series Reconstruction. Microscopy and Microanalysis, 13: 768-769. doi: 10.1017/S1431927607072212.

  1706. Herzing, A. A., Tang, Z.-R., Edwards, J. K., Enache, D. I., Jonathan, K., Taylor, S., Carley, A. F., Kiely, C. J., & Hutchings, G. J. (2007). Characterization of Au-based Catalysts Using Novel Cerium Oxide Supports. Microscopy and Microanalysis, 13: 102-103. doi: 10.1017/S14319276070766.

  1707. Hirahara, K., Yamasaki, J., Saitoh, K., & Tanaka, N. (2007). Depth Sensitivity of Cs-Corrected TEM Imaging. Microscopy and Microanalysis, 13: 890-891. doi: 10.1017/S1431927607077422.

  1708. Hirata, A., Hirotsu, Y., Nieh, T. G., Ohkubo, T., & Tanaka, N. (2007). Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmission electron microscopy. Ultramicroscopy, 107: 116-123. doi: 10.1016/j.ultramic.2006.06.002

  1709. Houdellier, F. & Hytch, M. (2007). Determination of the structure-factor phase in non-centrosymmetric crystals by qunatitative CHEF. Microscopy and Microanalysis, 13: 124-125. doi: 10.1017/S1431927607080622

  1710. Hytch, M. & Houdellier, F. (2007). Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy. Microelectronic Engineering, 84: 460-463. doi: 10.1016/j.mee.2006.10.062.

  1711. Hytch, M. J., Hue, F., Houdellier, F., & Snoeck, E. (2007). Applications of Aberration-free Microscopy from Strain Mapping to Quantitative Electron Diffraction. Microscopy and Microanalysis, 13: 1184-1185. doi: 10.1017/S1431927607077586.

  1712. Idrobo, J., Halabica, A., Rashkeev, S., Glazoff, M., Boatner, L., Haglund, R., Pennycook, S., & Pantelides, S. (2007). Atomic-Scale Characterization and Optical Properties of Metal Nanoparticles Embedded in Alumina Matrices. Microscopy and Microanalysis, 13: 1190-1191. doi: 10.1017/S1431927607077045.

  1713. Ikuhara, Y., Buban, J., Sato, Y., Shibata, N., & Yamamoto, T. (2007). STEM Characterization of Ceramic Grain Boundaries. Microscopy and Microanalysis, 13: 1172-1173. doi: 10.1017/S1431927607075551.

  1714. Irsen, S., Kelm, K., Schillinger, R., Schmidt, H., Schmalzried, C., Telle, R., Mader, W., & Quandt, E. (2007). A new monochromated and illumination-CS-corrected HR(S)TEM: First applications in material sciences. Microscopy and Microanalysis, 13: 6-7. doi: 10.1017/S1431927607080038

  1715. Jiang, J., Yuan, J., & Bleloch, A. (2007). Cluster scale composition determination in a boron-rich compound. Applied Physics Letters, 91: 113107.

  1716. Johnson, C. L., Snoeck, E., & Hytch, M. J. (2007). Strain Distributions in Au Nanoparticles by Aberration-Corrected HREM. Microscopy and Microanalysis, 13: 1194-1195. doi: 10.1017/S1431927607077306.

  1717. Kiely, C., Herzing, A., Watanabe, M., Edwards, J., Enache, D., Carley, A., & Hutchings, G. (2007). Aberration Corrected Analytical Electron Microscopy of Supported Bimetallic Catalysts. Microscopy and Microanalysis, 13: 864-865. doi: 10.1017/S1431927607076696.

  1718. Klie, R., Hammas, E., Zhao, Y., Yang, G., & Zhu, Y. (2007). Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS. Microscopy and Microanalysis, 13: 1178-1179. doi: 10.1017/S1431927607071838.

  1719. Koschan, A., Mercimek, M., Abidi, M., Borisevich, A., Lupini, A., & Pennycook, S. (2007). Improving 3D Reconstruction from STEM Data. Microscopy and Microanalysis, 13: 1664-1665. doi: 10.1017/S1431927607075095.

  1720. Krivanek, O., Corbin, G., Dellby, N., Elston, B., Keyse, R., Murfitt, M., Own, C., & Szilagyi, Z. (2007). UltraSTEM Progress: Flexible Electron Optics, High-Performance Sample Stage. Microscopy and Microanalysis, 13: 878-879. doi: 10.1017/S1431927607078774.

  1721. Linck., M. (2007). Optimum Imaging Conditions for Recording High-Resolution Electron Holograms in a CS-corrected TEM. Microscopy and Microanalysis, 13: 32-33. doi: 10.1017/S1431927607080166

  1722. Liu, F., Collazo, R., Mita, S., Duscher, G., & Pennycook, S. (2007). The mechanism for polarity inversion of GaN via a thin AlN layer: Direct experimental evidence (vol 91, art no 203115, 2007). Applied Physics Letters, 91. doi: 10.1063/1.2836941.

  1723. Liu, Z., Yanagi, K., Suenaga, K., Kataura, H., & Iijima, S. (2007). Imaging the dynamic behaviour of individual retinal chromophores confined inside carbon nanotubes. Nature Nanotechnology, 2: 422-425. doi: 10.1038/nnano.2007.187

  1724. Lozano-Perez, S. & Titchmarsh, J. M. (2007). EFTEM assistant: A tool to understand the limitations of EFTEM. Ultramicroscopy, 107: 313-321. doi: 10.1016/j.ultramic.2006.08.006.

  1725. Lupini, A. (2007). Aberration corrected imaging in the STEM. Microscopy and Microanalysis, 13: 4-4. doi: 10.1017/S1431927607076015.

  1726. Luysberg, M., Boese, M., Avila, D., Heeg, T., & Schubert, J. (2007). Structure and electronic properties of scandate/titanate multilayers determined by high-resolution TEM/STEM and EELS. Microscopy and Microanalysis, 13: 368-369. doi: 10.1017/S1431927607081846

  1727. Mayer, J., Houben, L., Lopatin, S., Luysberg, M., & Thust, A. (2007). Performance and Applications of the Aberration Corrected TEM and STEM Instruments at the Ernst Ruska-Centre. Microscopy and Microanalysis, 13: 128-129. doi: 10.1017/S1431927607074296.

  1728. Mejia-Rosales, S. J., Fernandez-Navarro, C., Perez-Tijerina, E., Blom, D. A., Allard, L. F., & Jose-Yacaman, M. (2007). On the Structure of Au / Pd Bimetallic Nanoparticles. J. Phys. Chem. C, 111: 1256-1260. doi: 10.1021/jp066328h

  1729. Mkhoyan, A., Batson, P., Cha, J., Schaff, W., & Silcox, J. (2007). Direct Determination of Local Lattice Polarity in Crystals. Microscopy and Microanalysis, 13: 1188-1189. doi: 10.1017/S1431927607073539.

  1730. Molina, S., Varela, M., Sales, D., Ben, T., Pizarro, J., Galindo, P., Fuster, D., Gonzalez, Y., Gonzalez, L., & Pennycook, S. (2007). Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images. Microscopy and Microanalysis, 13: 746-747. doi: 10.1017/S1431927607074971.

  1731. Nakamura, K., Inada, H., Tanaka, H., Konno, M., & Yaguchi, T. (2007). Atomic Scale Imaging and High Sensitive Elemental Analysis with an Aberration Corrected Dedicated STEM. Microscopy and Microanalysis, 13: 886-887. doi: 10.1017/S1431927607073321.

  1732. Neiner, D., Okamoto, N. L., Condron, C. L., Ramasse, Q. M., Yu, P., Browning, N. D., & Kauzlarich, S. M. (2007). Hydrogen encapsulation in a silicon clathrate type I structure: Na5.5(H2)2.15Si46: synthesis and characterization. Journal of the American Chemical Society, 129: 13857-13862. doi: 10.1021/ja0724700

  1733. Nellist, P. D., Cosgriff, E. C., Behan, G., & Kirkland, A. I. (2007). Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM. Microscopy and Microanalysis, 13: 130-131. doi: 10.1017/S14319276070732.

  1734. Nicolosi, V., Nellist, P. D., Sanvito, S., Cosgriff, E. C., Krishnamurthy, S., Blau, W. J., Green, M. L. H., Vengust, D., Dvorsek, D., Mihailovic, D., Compagnini, G., Sloan, J., Stolojan, V., Carey, J. D., Pennycook, S. J., & Coleman, J. N. (2007). Observation of van der Waals driven self-assembly of MoSI nanowires into a low-symmetry structure using aberration-corrected electron microscopy. Advanced Materials, 19: 543-547. doi: 10.1002/adma.200601867.

  1735. Oh, S. H., Benthem, K. V., Molina, S. I., Werner, P., Kumar, D., & Pennycook, S. (2007). Characterization of Gold on Silicon Nanowires using Aberration-corrected STEM. Microscopy and Microanalysis, 13: 758-759. doi: 10.1017/S1431927607076684.

  1736. Okamoto, N. L., Neiner, D., Ramasse, Q. M., Condron, C. L., Kauzlarich, S. M., & Browning, N. D. (2007). Characterization of Hydrogen-Encapsulated Type-I Silicon Clathrate. Microscopy and Microanalysis, 13: 1176-1177. doi: 10.1017/S1431927607071292.

  1737. Oxley, M. P., van Benthem, K., Peng, Y., & Pennycook, S. J. (2007). Image Contrast in High Resolution Aberration Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 13: 906-907. doi: 10.1017/S1431927607076428

  1738. Pan, Y., Brown, A. P., Sader, K., Trinick, J., Brydson, R., Bleloch, A., & Gass, M. (2007). Aberration Corrected Scanning TEM Applied to Biological Specimens. Microscopy and Microanalysis, 13: 132-133. doi: 10.1017/S14319276070725.

  1739. Pennycook, S. (2007). New views of materials through aberration-corrected STEM. Microscopy and Microanalysis, 13: 1168-1169. doi: 10.1017/S1431927607076842.

  1740. Pennycook, S. J., Van Benthem, K., Oxley, M. P., Rashkeev, S. N., & Pantelides, S. T. (2007). From 3D Imaging of Atoms to Macroscopic Device Properties. Microscopy and Microanalysis, 13: 82-83. doi: 10.1017/S14319276070774.

  1741. Petersen, T. C. & Keast, V. J. (2007). Astigmatic intensity equation for electron microscopy based phase retrieval. Ultramicroscopy, 107: 635-643. doi: 10.1016/j.ultramic.2006.12.005

  1742. Porter, A. E., Gass, M., Muller, K., Skepper, J. N., Midgley, P. A., & Welland, M. (2007). Direct imaging of single-walled carbon nanotubes in cells. Nature Nanotechnology, 2> 713-717. doi: 10.1038/nnano.2007.347

  1743. Ringnalda, J., Freitag, B., Hubert, D., & Stekelenburg, M. (2007). Practical Electron Microscopy with Correctors and Monochromators. Microscopy and Microanalysis, 13: 860-861. doi: 10.1017/S143192760707691X.

  1744. Sadan, H. & Kaplan, W. D. (2007). Correlating Interfacial Energy with Orientation and Atomistic Structure at Metal Ceramic Interfaces. Microscopy and Microanalysis, 13: 900-901. doi: 10.1017/S1431927607077823.

  1745. Sato, Y., Suenaga, K., Okubo, S., Okazaki, T., & Iijima, S. (2007). Structures of D5d-C80 and Ih-Er3N@C80 Fullerenes and Their Rotation Inside Carbon Nanotubes Demonstrated by Aberration-Corrected Electron Microscopy. Nano Letters, 7: 3704-3708. doi: 10.1021/nl0720152

  1746. Sawada, H., Hosokawa, F., Sannomiya, T., Kaneyama, T., Tomita, T., Kondo, Y., Tanaka, T., Oshima, Y., Tanishiro, Y., & Takayanagi, K. (2007). Development of Spherical Aberration Corrected 300kV FETEM. Microscopy and Microanalysis, 13: 880-881. doi: 10.1017/S1431927607077069.

  1747. Schlossmacher, P., Kuebel, C., Freitag, B., Hubert, D., & Perquin, R. (2007). New Developments in Focal-Series Reconstruction. Microscopy and Microanalysis, 13: 1170-1171. doi: 10.1017/S1431927607075976.

  1748. Schroder, R. R., Barton, B., Rose, H. H., & Benner, G. (2007). Contrast enhancement by anamorphotic phase plates in an aberration-corrected TEM. Microscopy and Microanalysis, 13: 136-137. doi: 10.1017/S143192760708004X

  1749. Serin, V., Houdellier, F., Warot-Fonrose, B., Calmels, L., Stoger-Pollach, M., Hebert, C., Rubino, S., Schattschneider, P., Rusz, J., Novak, P., Hytch, M., & Snoeck, E. (2007). State of the Art in Energy Loss Magnetic Chiral Dichroism (EMCD). Microscopy and Microanalysis, 13: 1286-1287. doi: 10.1017/S1431927607073126.

  1750. Shannon, M. D., Lok, C. M., & Casci, J. L. (2007). Imaging promoter atoms in FischerTropsch cobalt catalysts by aberration-corrected scanning transmission electron microscopy. Journal of Catalysis, 249: 41-51. doi: 10.1016/j.jcat.2007.03.021.

  1751. Svete, M., Houben, L., Tillmann, K., & Mader, W. (2007). Imaging Light Atoms at Sub-Angstrom Resolution in an Image Side C S -Corrected Electron Microscope FEI Titan 80-300. Microscopy and Microanalysis, 13: 30-31. doi: 10.1017/S1431927607080154

  1752. Tanaka, N. (2007). Effectiveness of Cs-corrected TEM/STEM for nano-materials research. Microscopy and Microanalysis, 13: 60-61. doi: 10.1017/S1431927607075708.

  1753. Tanaka, T., Ando, M., Sano, K., Hosokawa, F., Kondo, Y., Yamamoto, N., & Takayanagi, K. (2007). Active-site imaging in catalyst of Au nanoparticle on rutile-TiO2 by combination of aberration-corrected TEM and gas inlet TEM holder. Microscopy and Microanalysis, 13: 1204-1205. doi: 10.1017/S1431927607074375.

  1754. van Benthem, K., Oh, S.-H., Oxley, M., Rashkeev, S., Marinopoulos, A., Buzcko, R., Pantelides, S. T., & Pennycook, S. (2007). Local Structure Characterization in Nanomaterials using Aberration Corrected STEM. Microscopy and Microanalysis, 13: 1182-1183. doi: 10.1017/S1431927607076490.

  1755. van Benthem, K., Painter, G. S., Becher, P. F., Contescu, C. I., Gallego, N. C., & Pennycook, S. (2007). High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM. Microscopy and Microanalysis, 13: 870-871. doi: 10.1017/S1431927607076507.

  1756. Watanabe, M., Hojo, H., Ackland, D., Kiely, C., & Williams, D. (2007). Applications of Aberration-Corrected Scanning Transmission Electron Microscopy for Atomic-Scale Characterization. Microscopy and Microanalysis, 13: 1198-1199. doi: 10.1017/S1431927607079020.

  1757. Watanabe, M., Kanno, M., Ackland, D., Kiely, C., & Williams, D. (2007). Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-2200FS STEM/TEM. Microscopy and Microanalysis, 13: 1264-1265. doi: 10.1017/S1431927607079184.

  1758. Watanabe, M. & Williams, D. (2007). Development of Diffraction Imaging for Orientation Analysis of Grains in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 13: 962-963. doi: 10.1017/S1431927607075204.

  1759. Williams, D., Ackland, D., & Watanabe, M. (2007). Quantification of X-ray Spectrum Images in the Analytical Electron Microscope: Progress Toward Single-Atom-Detection Limits. Microscopy and Microanalysis, 13: 1348-1349. doi: 10.1017/S143192760707897X.

  1760. Yamasaki, J., Kawai, T., Kondo, Y., & Tanaka, N. (2007). Practical Solution for Artificial Image Contrasts in Cs-corrected TEM. Microscopy and Microanalysis, 13: 882-883. doi: 10.1017/S1431927607078397.

  1761. Yamasaki, J., Okunishi, E., Sawada, H., & Tanaka, N. (2007). Direct Observation of Site Hopping of Individual Dopant Atoms in Si Crystal, by Cs-corrected STEM. Microscopy and Microanalysis, 13: 1186-1187. doi: 10.1017/S1431927607078324.

  1762. Yaney, D. L. (2007). Characterization of Magnetic Recording Devices Using a JEOL 2200FS Aberration-Corrected STEM/TEM. Microscopy and Microanalysis, 13: 88-89. doi: 10.1017/S14319276070770.

  1763. Yu, W., Houben, L., Tillmann, K., & Mader, W. (2007). Phase Contrast and HAADF Imaging of Structures in In2O3-ZnO Compounds in CS-Corrected Electron Microscopes. Microscopy and Microanalysis, 13: 28-29. doi: 10.1017/S1431927607080142

  1764. Zaluzec, N. J. (2007). Scanning Confocal Electron Microscopy. Microscopy and Microanalysis, 13: 1560-1561. doi: 10.1017/S1431927607073990.

  1765. Zhang, Z., Biskupek, J., Kaiser, U. A., Breus, V. V., Nienhaus, G. U., Wiedwald, U., Han, L., Boyen, H.-G., & Ziemann, P. (2007). Structural Studies of Nanoparticles with an Objective Lens CS-Corrected Titan Microscope. Microscopy and Microanalysis, 13: 258-259. doi: 10.1017/S1431927607081299

  1766. Zhang, Z. & Kaiser, U. (2007). Imaging the six-Membered ring in Si3N4 by a Cs-corrected HRTEM. Microscopy and Microanalysis, 13: 892-893. doi: 10.1017/S143192760707729X.

  1767. Zhao, D., Aoki, T., Koley, G., & Cai, Z. (2007). Performance characteristics of an aberration-corrected Jeol JEM 2100F STEM/TEM at the university of South Carolina. Microscopy and Microanalysis, 13: 1166-1167. doi: 10.1017/S1431927607072145.

  1768. 2006


  1769. Arslan, I. & Browning, N. D. (2006). Atomic scale defect analysis in the scanning transmission electron microscope. Microscopy Research and Technique, 69: 330-342. doi: 10.1002/jemt.20289.

  1770. Batson, P. E. (2006). Characterizing probe performance in the aberration corrected STEM. Ultramicroscopy, 106: 1104-1114. doi: 10.1016/j.ultramic.2006.04.025.

  1771. Bleloch, A., Falke, U., & Bangert, U. (2006). Bright Enough to See Atoms? Microscopy and Microanalysis, 12: 1356-1357. doi: 10.1017/S1431927606067468.

  1772. Blom, D., Bradley, S., Sinkler, W., & Allard, L. (2006). Observation of Pt Atoms, Clusters and Rafts on Oxide Supports, by Sub-Angstrom Z-Contrast Imaging in an Aberration-Corrected STEM/TEM. Microscopy and Microanalysis, 12: 50. doi: 10.1017/S1431927606068711.

  1773. Blom, D. A., Allard, L. F., Mishina, S., & O'Keefe, M. A. (2006). Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory. Microscopy and Microanalysis, 12: 483-491. doi: 10.1017/S1431927606060570.

  1774. Borisevich, A. Y., Lupini, A. R., & Pennycook, S. J. (2006). Depth sectioning with the aberration-corrected scanning transmission electron microscope. Proceedings of the National Academy of Sciences of the United States of America, 103: 3044-3048. doi: 10.1073/pnas.0507105103.

  1775. Browning, N. D., Arslan, I., Erni, R., Idrobo, J. C., Ziegler, A., Bradley, J., Dai, Z., Stach, E. A., & Bleloch, A. (2006). Monochromators and aberration correctors: Taking EELS to new levels of energy and spatial resolution. Journal of Physics Conference Series, 26: 59-64. doi: 10.1088/1742-6596/26/1/014.

  1776. Erni, R., Freitag, B., Hartel, P., Muller, H., Tiemeijer, P., Van Der Stam, M., Stekelenburg, M., Hubert, D., Specht, P., & Garibay-Febles, V. (2006). Atomic scale analysis of planar defects in polycrystalline diamond. Microscopy and Microanalysis, 12: 492-497. doi: 10.1017/S1431927606060594.

  1777. Erni, R., Tiemeijer, P., Kujawa, S., Stam, M. V. D., Stekelenburg, M., & Freitag, B. (2006). A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level. Microscopy and Microanalysis, 12: 1372-1373. doi: 10.1017/S1431927606065615.

  1778. Freitag, B., Stam, M. V. D., Erni, R., Lopatin, S., & Stekelenburg, M. (2006). A New Era of Imaging. New Results Beyond the 1 Angstrom Barrier. Microscopy and Microanalysis, 12: 1466-1467. doi: 10.1017/S1431927606065664.

  1779. Furuya, K., Mitsuishi, K., Tanaka, M., Takeguchi, M., Kondo, Y., Hosokawa, F., Okamoto, K., Sannomiya, T., Hori, M., Iwama, T., & Kawazoe, M. (2006). The Development of Ultra-high Vacuum Cs-Corrected Scanning Transmission Electron Microscope for Fast Fabrication of Desired Nanostructures. Microscopy and Microanalysis, 12: 1366-1367. doi: 10.1017/S1431927606063197.

  1780. Gontard, L. C., Chang, L.-Y., Dunin-Borkowski, R. E., Kirkland, A. I., Hetherington, C. J. D., & Ozkaya, D. (2006). The application of spherical aberration correction and focal series restoration to high-resolution images of platinum nanocatalyst particles. Journal of Physics: Conference Series, 26: 25-28. doi: 10.1088/1742-6596/26/1/006.

  1781. Gontard, L. C., Dunin-Borkowski, R. E., Hytch, M. J., & Ozkaya, D. (2006). Delocalisation in images of Pt nanoparticles. Journal of Physics: Conference Series, 26: 292-295. doi: 10.1088/1742-6596/26/1/070.

  1782. Hetherington, C., Kirkland, A., Doole, R., Cockayne, D., Titchmarsh, J., & Hutchison, J. (2006). High Resolution Imaging Using the Oxford Aberration Corrected TEM. Microscopy and Microanalysis, 12: 1454-1455. doi: 10.1017/S1431927606065093.

  1783. Hirahara, K., Saitoh, K., Yamasaki, J., & Tanaka, N. (2006). Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEM. Nano Letters, 6: 1778-1783. doi: 10.1021/nl060458k.

  1784. Houben, L. (2006). Aberration-Corrected HRTEM of Defects in Strained Lanthanum Cuprate Thin Films Grown on Strontium Titanate. Microscopy and Microanalysis, 12: 1474-1475. doi: 10.1017/S1431927606065305.

  1785. Houben, L., Thust, A., & Urban, K. (2006). Atomic-precision determination of the reconstruction of a 90 degree tilt boundary in YBa2Cu3O7-delta by aberration corrected HRTEM. Ultramicroscopy, 106: 200-14. doi: 10.1016/j.ultramic.2005.07.009.

  1786. Jia, C. L. (2006). Atom vacancies at a screw dislocation core in SrTiO3. Philosophical Magazine Letters, 86: 683-690. doi: 10.1080/09500830600965087.

  1787. Jose-Yacaman, M., Mejia-Rosales, S., Perez-Tijerina, E., Blom, D., & Allard, L. (2006). Imaging Au-Pd Nanoparticles with the Aberration-Corrected STEM/TEM. Microscopy and Microanalysis, 12: 772-773. doi: 10.1017/S1431927606069674.

  1788. Kirkland, A. I., Meyer, R. R., & Chang, L.-Y. S. (2006). Local Measurement and Computational Refinement of Aberrations for HRTEM. Microscopy and Microanalysis, 12: 461. doi: 10.1017/S1431927606060612.

  1789. Klie, R., Schofield, M., Varela, M., Pennycook, S., Bleloch, A., & Zhu, Y. (2006). Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-contrast Imaging and EELS. Microscopy and Microanalysis, 12: 112-113. doi: 10.1017/S1431927606062052.

  1790. Klie, R. & Zhu, Y. (2006). Atomic-Resolution Imaging in the Aberration-Corrected BNL JEM2200FS. Microscopy and Microanalysis, 12: 1358-1359. doi: 10.1017/S1431927606066104.

  1791. Lentzen, M. (2006). Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction. Microscopy and Microanalysis, 12: 191-205. doi: 10.1017/S1431927606060326.

  1792. Maurice, J. L., Carretero, C., Casanove, M. J., Bouzehouane, K., Guyard, S., Larquet, E., & Contour, J. P. (2006). Electronic conductivity and structural distortion at the interface between insulators SrTiO3 and LaAlO 3. Physica Status Solidi A, 203: 2209-2214. doi: 10.1002/pssa.200566033.

  1793. McBride, J., Treadway, J., Feldman, L. C., Pennycook, S. J., & Rosenthal, S. J. (2006). Structural basis for near unity quantum yield core/shell nanostructures. Nano Letters, 6: 1496-1501. doi: 10.1021/nl060993k.

  1794. Mitsuishi, K., Takeguchi, M., Kondo, Y., Hosokawa, F., Okamoto, K., Sannomiya, T., Hori, M., Iwama, T., Kawazoe, M., & Furuya, K. (2006). Ultrahigh-Vacuum Third-Order Spherical Aberration (Cs) Corrector for a Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 12: 456-460. doi: 10.1017/S1431927606060661.

  1795. Mkhoyan, K. A., Batson, P. E., Cha, J., Schaff, W. J., & Silcox, J. (2006). Direct determination of local lattice polarity in crystals. Science, 312: 1354. doi: 10.1126/science.1124511.

  1796. Muller, H., Uhlemann, S., Hartel, P., & Haider, M. (2006). Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 12: 442-455. doi: 10.1017/S1431927606060600.

  1797. Nellist, P. D., Chisholm, M. F., Lupini, A. R., Borisevich, A., Sides, W. H., Pennycook, S. J., Dellby, N., Keyse, R., Krivanek, O. L., Murfitt, M. F., & Szilagyi, Z. S. (2006). Aberration-corrected STEM: current performance and future directions. Journal of Physics: Conference Series, 26: 7-12. doi: 10.1088/1742-6596/26/1/002.

  1798. Nellist, P. D., Cosgriff, E. C., Nicolosi, V., & Coleman, J. N. (2006). Three-dimensional Characterisation of Nanomaterials Using Aberration-Corrected STEM. Microscopy and Microanalysis, 12: 1338-1339. doi: 10.1017/S1431927606063094.

  1799. Nicolosi, V., Nellist, P., Sloan, J., Mhailovic, D., Green, M., Blau, W. J., & Coleman, J. N. (2006). Mo6S4.5I4.5 nanowires: Structure studies by HRTEM and aberration corrected STEM. In P. D. Brown, R. Baker, & B. Hamilton, editors, EMAGNANO 2005 Imaging Analysis and Fabrication on the Nanoscale, volume 26 of Journal of Physics Conference Series, 260-263. Iop Publishing Ltd. doi: 10.1088/1742-6596/26/1/062.

  1800. Peng, Y., Oxley, M., Lupini, A., Chisholm, M., & Pennycook, S. (2006). Ultimate Resolution Limit for Zcontrast STEM: Atoms are Smaller in ADF. Microscopy and Microanalysis, 12: 1340-1341. doi: 10.1017/S1431927606067572.

  1801. Pennycook, S., Chisholm, M., Lupini, A., Peng, Y., Varela, M., Van Benthem, K., Borisevich, A., de Jonge, N., & Oxley, M. (2006). Aberration-Corrected STEM - More than just Higher Resolution. Microscopy and Microanalysis, 12: 132-133. doi: 10.1017/S1431927606069650.

  1802. Pennycook, S. J. & Kirkland, A. I. (2006). Materials Advances through Aberration- Corrected Electron. MRS Bulletin, 31: 36-43.

  1803. Ramasse, Q., Bleloch, A., Klie, R., & Browning, N. (2006). Advanced Tuning Algorithm for Crystalline Materials in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 12: 1342-1343. doi: 10.1017/S1431927606067511.

  1804. Sanchez, A. M., Galindo, P. L., Kret, S., Falke, M., Beanland, R., & Goodhew, P. J. (2006). Quantitative strain mapping applied to aberration-corrected HAADF images. Microscopy and Microanalysis, 12: 285-294. doi: 10.1017/S1431927606060363.

  1805. Tanaka, N., Yamasaki, J., Hirahara, K., Yoshida, K., & Saitoh, K. (2006). Present Status of Cs-corrected HRTEM and Future Prospects. Microscopy and Microanalysis, 12: 158-159. doi: 10.1017/S1431927606064233.

  1806. Tang, C. Y., Chen, J. H., Zandbergen, H. W., & Li, F. H. (2006). Image deconvolution in spherical aberration-corrected high-resolution transmission electron microscopy. Ultramicroscopy, 106: 539-546. doi: 10.1016/j.ultramic.2006.01.008.

  1807. Tillmann, K., Houben, L., & Thust, A. (2006). Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval. Philosophical Magazine, 86: 4589-4606. doi: 10.1080/14786430600675763.

  1808. van Benthem, K., Lupini, A. R., Oxley, M. P., Findlay, S. D., Allen, L. J., & Pennycook, S. J. (2006). Three-dimensional ADF imaging of individual atoms by through-fohree-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy.cal series scanning transmission electron microscopy. Ultramicroscopy, 106: 1062-8. doi: 10.1016/j.ultramic.2006.04.020.

  1809. Van der Stam, M. A., Freitag, B., Erni, R., Tiemeijer, P., Stekelenburg, M., Hubert, D., & Ringnalda, J. (2006). Design Advances and New Results of a Sub-Angstrom Dedicated Corrector S/TEM. Microscopy and Microanalysis, 12: 1370-1371. doi: 10.1017/S1431927606065573.

  1810. Varela, M., Pennycook, T. J., Tian, W., Mandrus, D., Pennycook, S. J., Pena, V., Sefrioui, Z., & Santamaria, J. (2006). Atomic scale characterization of complex oxide interfaces. Journal of Materials Science, 41: 4389-4393. doi: 10.1007/s10853-006-0150-4.

  1811. Voyles, P. M. (2006). Imaging single atoms with Z-contrast scanning transmission electron microscopy in two and three dimensions. Microchimica Acta, 155: 5-10. doi: 10.1007/s00604-006-0500-6.

  1812. Walther, T., Quandt, E., Stegmann, H., Thesen, A., & Benner, G. (2006). First experimental test of a new monochromated and aberration-corrected 200 kV field-emission scanning transmission electron microscope. Ultramicroscopy, 106: 963-969. doi: 10.1016/j.ultramic.2006.04.014.

  1813. Walther, T. & Stegmann, H. (2006). Preliminary results from the first monochromated and aberration corrected 200-kV field-emission scanning transmission electron microscope. Microscopy and Microanalysis, 12: 498-505. doi: 10.1017/S1431927606060697.

  1814. Wang, P., Bleloch, A. L., Falke, M., Goodhew, P. J., Ng, J., & Missous, M. (2006). Direct measurement of composition of buried quantum dots using aberration-corrected scanning transmission electron microscopy. Applied Physics Letters, 89: 072111 (3 pages). doi: 10.1063/1.2335361.

  1815. Ward, E. P. W., Arslan, I., Bleloch, A., Thomas, J. M., & Midgley, P. A. (2006). Nano-metrology of platinum-ruthenium bimetallic catalysts and the cluster-to-crystal transformation. Journal of Physics: Conference Series, 26: 207-210. doi: 10.1088/1742-6596/26/1/049.

  1816. Watanabe, M., Ackland, D. W., Burrows, A., Kiely, C. J., Williams, D. B., Krivanek, O. L., Dellby, N., Murfitt, M. F., & Szilagyi, Z. (2006). Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction. Microscopy and Microanalysis, 12: 515-526.

  1817. Watanabe, M., Saxey, D., Zheng, R., Williams, D., & Ringer, S. (2006). Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques. Microscopy and Microanalysis, 12: 534-535. doi: 10.1017/S1431927606065329.

  1818. Williams, D. & Watanabe, M. (2006). Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 12: 1344-1345. doi: 10.1017/S1431927606065238.

  1819. Yamazaki, T., Kotaka, Y., Kikuchi, Y., & Watanabe, K. (2006). Precise measurement of third-order spherical aberration using low-order zone-axis Ronchigrams. Ultramicroscopy, 106: 153-163. doi: 10.1016/j.ultramic.2005.07.001.

  1820. Yamazaki, T., Kuramochi, K., Hashimoto, I., & Watanabe, K. (2006). Precise measurement of local strain fields with energy-unfiltered convergent-beam electron diffraction Precise measurement of local strain fields with energy-unfiltered convergent-beam electron diffraction. Acta crystallographica Section A, 62: 201-207. doi: 10.1107/S010876730600924X.

  1821. Yoshida, K., Kawai, T., Nambara, T., Tanemura, S., Saitoh, K., & Tanaka, N. (2006). Direct observation of oxygen atoms in rutile titanium dioxide by spherical aberration corrected high-resolution transmission electron microscopy. Nanotechnology, 17: 3944-3950. doi: 10.1088/0957-4484/17/15/056.

  1822. Zhu, Y., Beetz, T., Wu, L., Klie, R., Huang, L., Lau, J. W., Schofield, M. A., Volkov, V. V., Beleggia, M., & Malac, M. (2006). Measurements of Functional Response of Nano-objects using Advanced Electron Microscopy. Microscopy and Microanalysis, 12: 540-541. doi: 10.1017/S143192760606925X.

  1823. 2005


  1824. Abe, E. & Pennycook, S. J. (2005). Direct Imaging of Point Defects in a Quasicrystal by Cs-Corrected Ultrahigh-Resolution 300kV-STEM. Microscopy and Microanalysis, 11: 550-551. doi: 10.1017/S1431927605510808.

  1825. Allard, L. F., Blom, D. A., O'Keefe, M. A., & Mishina, S. (2005). Design and Performance Characteristics of the ORNL Advanced Microscopy Laboratory and JEOL 2200FS-AC Aberration-Corrected STEM/TEM. Microscopy and Microanalysis, 11: 2136-2137. doi: 10.1017/S143192760550878X.

  1826. Arslan, I., Bleloch, A., Stach, E. A., & Browning, N. D. (2005). Atomic and electronic structure of mixed and partial dislocations in GaN. Physical Review Letters, 94: 025504 (4pages). doi: 10.1103/PhysRevLett.94.025504.

  1827. Batson, P. E. (2005). Atomic Motion Observed with the IBM Sub-Angstrom STEM. Microscopy and Microanalysis, 11: 2124-2125. doi: 10.1017/S1431927605508596.

  1828. Bhirud, V. A., Moses, M. J., Blom, D. A., Allard, L. F., Aoki, T., Mishina, S., Narula, C. K., & Gates, B. C. (2005). Alumina-supported Tri-rhenium Clusters Revealed by Aberration-corrected Electron Microscopy. Microscopy and Microanalysis, 11: 1574-1575. doi: 10.1017/S1431927605509814.

  1829. Bleloch, A., Falke, M., & Falke, U. (2005). Cobalt Disilicide/Silicon(001) Interfaces. Microscopy and Microanalysis, 11: 1418-1419. doi: 10.1017/S1431927605505683.

  1830. Bleloch, A., Wang, P., Falke, U., & Goodhew, P. (2005). High Angle Annular Dark Field Imaging On and Away from the Pole. Microscopy and Microanalysis, 11: 2128-2129. doi: 10.1017/S1431927605505737.

  1831. Blom, D. A., Allard, L. F., O'Keefe, M. A., & Mishina, S. (2005). High Resolution Imaging with an Aberration Corrected JEOL 2200FS-AC STEM/TEM. Microscopy and Microanalysis, 11: 548-549. doi: 10.1017/S143192760551050X.

  1832. Freitag, B., Busing, W., Plitzko, J. M., Luecken, U., Storms, M., & Hax, W. (2005). STEM Imaging Optimized for Biological Specimen. Microscopy and Microanalysis, 11: 334-335. doi: 10.1017/S1431927605507256.

  1833. Freitag, B., Kujawa, S., Mul, P. M., Ringnalda, J., & Tiemeijer, P. C. (2005). Breaking the spherical and chromatic aberration barrier in transmission electron microscopy. Ultramicroscopy, 102: 209-214. doi: 10.1016/j.ultramic.2004.09.013.

  1834. Giannuzzi, L. A., Geurts, R., & Ringnalda, J. (2005). 2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon. Microscopy and Microanalysis, 11: 828-829. doi: 10.1017/S1431927605507797.

  1835. Hanrath, T., Lee, D. C., Korgel, B. A., & Diebold, A. (2005). TEM and MultiSlice Simulation Investigation of Si and Ge Nanowires. Microscopy and Microanalysis, 11: 1918-1919. doi: 10.1017/S1431927605504203.

  1836. Hetherington, C. J. D., Cockayne, D. J. H., Doole, R. C., Hutchison, J. L., Kirkland, A. I., & Titchmarsh, J. M. (2005). Aberration-corrected HREM/STEM for semiconductor research. Microscopy of Semiconducting Materials, 107: 177-182. doi: 10.1007/3-540-31915-8_36.

  1837. Houben, L., Thust, A., & Urban, K. (2005). Atomic Precision Measurement of Individual Atom Positions in Defects by Aberration Corrected HRTEM. Microscopy and Microanalysis, 11: 2122-2123. doi: 10.1017/S1431927605505397.

  1838. Hutchison, J. L., Titchmarsh, J. M., Cockayne, D. J. H., Doole, R. C., Hetherington, C. J. D., Kirkland, A. I., & Sawada, H. (2005). A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. Ultramicroscopy, 103: 7-15. doi: 10.1016/j.ultramic.2004.11.010.

  1839. Kotaka, Y., Yamazaki, T., Watanabe, K., Kikuchi, Y., Nakanishi, N., & Hashimoto, I. (2005). Measurement of 3rd Order Spherical Aberration Coefficient for Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 11: 2166-2167. doi: 10.1017/S1431927605503404.

  1840. Krivanek, O. L., Dellby, N., McManama-Smith, A., Murfitt, M., Nellist, P. D., & Own, C. S. (2005). An Aberration-Corrected STEM for Diffraction Studies. Microscopy and Microanalysis, 11: 544-545. doi: 10.1017/S1431927605510535.

  1841. Lehmann, M., Geiger, D., & Lichte, H. (2005). First Experiences using Electron Holography with a Cs-Corrected TEM. Microscopy and Microanalysis, 11: 2146-2147. doi: 10.1017/S1431927605505221.

  1842. Lupini, A. R., Veith, G. M., Dudney, N. J., Chisholm, M. F., Van Benthem, K., Varela, M., Borisevich, A. Y., Peng, Y., Rashkeev, S., & Pennycook, S. J. (2005). Imaging of Materials through Aberration Corrected STEM. Microscopy and Microanalysis, 11: 2116-2117. doi: 10.1017/S1431927605507268.

  1843. O'Keefe, M. A., Allard, L. F., & Blom, D. A. (2005). HRTEM imaging of atoms at sub-Angstrom resolution. Journal of Electron Microscopy, 54: 169-180. doi: 10.1093/jmicro/dfi036.

  1844. Pan, Y., Brown, A., Brydson, R., Warley, A., Li, A., Powell, J., Bleloch, A., Falke, U., & Falke, M. (2005). TEM and STEM Studies of the Atomic Structure and Chemistry of Ferritin in Human Liver Biopsies. Microscopy and Microanalysis, 11: 1102-1103. doi: 10.1017/S1431927605507062.

  1845. Peng, Y., Borisevich, A. Y., Lupini, A. R., & Pennycook, S. J. (2005). Resolution Limit Measured by Fourier Transform: 0.61 Angstrom Information Transfer through HAADF-STEM. Microscopy and Microanalysis, 11: 2126-2127. doi: 10.1017/S1431927605509322.

  1846. Pennycook, S. J., Chisholm, M. F., Lupini, A. R., Peng, Y., Van Benthem, K., Borisevich, A., Findlay, S. D., Oxley, M. P., Allen, L. J., & Varela, M. (2005). Nanostructure Functionality through Aberration-Corrected STEM. Microscopy and Microanalysis, 11: 1416-1417. doi: 10.1017/S1431927605506093.

  1847. Pennycook, T. J., Varela, M., Van Benthem, K., & Pennycook, S. J. (2005). Low Energy-Loss Spectroscopic Studies of Grain Boundary Cores in Complex Oxides. Microscopy and Microanalysis, 11: 1466-1467. doi: 10.1017/S1431927605506421.

  1848. Plitzko, J. M., Freitag, B., Hegerl, R., & Luecken, U. (2005). Aberration Free Microscopy for Life Science Applications. Microscopy and Microanalysis, 11: 2140-2141. doi: 10.1017/S1431927605506147.

  1849. Ramasse, Q. M. & Bleloch, A. L. (2005). Diagnosis of aberrations from crystalline samples in scanning transmission electron microscopy. Ultramicroscopy, 106: 37-56. doi: 10.1016/j.ultramic.2005.06.007.

  1850. Sawada, H., Tomita, T., Naruse, M., Honda, T., Hambridge, P., Hartel, P., Haider, M., Hetherington, C., Doole, R., Kirkland, A. I., Hutchison, J. L., Titchmarsh, J., & Cockayne, D. (2005). Experimental evaluation of a spherical aberration corrected TEM and STEM. Journal of Electron Microscopy, 54: 119-121. doi: 10.1093/jmicro/dfi001.

  1851. Su, D. S., Schloegl, R., Kujawa, S., & Freitag, B. (2005). Interface Study of Silver Nano-particles Using an Image Cs-corrected TEM. Microscopy and Microanalysis, 11: 1550-1551. doi: 10.1017/S143192760550638X.

  1852. Thesen, A. E., Matijevic, M., & Benner, G. (2005). Design Features and Ultimate Performance of an Ultra-High Resolution Aberration-Corrected, Monochromatized 200 keV FEG-TEM. Microscopy and Microanalysis, 11: 2144-2145. doi: 10.1017/S1431927605500953.

  1853. Thust, A., Barthel, J., Houben, L., Jia, C. L., Lentzen, M., Tillmann, K., & Urban, K. (2005). Strategies for Aberration Control in Sub-Angstrom HRTEM. Microscopy and Microanalysis, 11: 58-59. doi: 10.1017/S1431927605503386.

  1854. Tillmann, K., Thust, A., Gerber, A., Weides, M. P., & Urban, K. (2005). Atomic structure of Beta-tantalum nanocrystallites. Microscopy and Microanalysis, 11: 534-544. doi: 10.1017/S1431927605050543.

  1855. van Benthem, K., Borisevich, A. Y., Chisholm, M. F., Lupini, A. R., Pantelides, S. T., Rashkeev, S., Varela, M., & Pennycook, S. J. (2005). Three Dimensional Characterization of Interfaces using Aberration-corrected STEM. Microscopy and Microanalysis, 11: 1452-1453. doi: 10.1017/S1431927605510055.

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  1905. Yamasaki, J., Kawai, T., & Tanaka, N. (2004). Direct observation of a stacking fault in Si(1 - x)Ge(x) semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM. Journal of Electron Microscopy, 53: 129-135. doi: 10.1093/jmicro/53.2.129.

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